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Inventor:
Livingstone; William John
Address:
Unerhill, VT
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
8136066 Apparatus and computer program product for semiconductor yield estimation March 13, 2012
A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for und
7496874 Semiconductor yield estimation February 24, 2009
A method, apparatus, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired o










 
 
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