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Inventor: Livingstone; William John
Address: Unerhill, VT
No. of patents: 2
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 8136066 |
Apparatus and computer program product for semiconductor yield estimation |
March 13, 2012 |
| A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for und |
| 7496874 |
Semiconductor yield estimation |
February 24, 2009 |
| A method, apparatus, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired o |
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