Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Livingstone; William John
Address:
Unerhill, VT
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
8136066 Apparatus and computer program product for semiconductor yield estimation March 13, 2012
A method, apparatus, system, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for und
7496874 Semiconductor yield estimation February 24, 2009
A method, apparatus, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired o










 
 
  Recently Added Patents
Method and system to generate finite state grammars using sample phrases
Nanoparticle entrapment of materials
Flood protection apparatus and container data center including the same
Toner cartridge and image forming apparatus including the same
Adaptive block pre-fetching method and system
System and method for managing content on a network interface
Semiconductor device, integrated circuit and method of manufacturing an integrated circuit
  Randomly Featured Patents
Molybdenum-copper and tungsten-copper alloys and method of making
Gripping member for well packer
Regeneration of diesel particulate filter
Portable traffic signaling and emergency response device
Multi-media wireless watch
High efficiency compression ignition aftertreatment devices for combined use of lean-burn combustion systems and three-way catalysts
Semiconductor device and manufacturing method thereof
Controlled-clearance sealing compressor devices
Plants and seeds of hybrid corn variety CH612245
Differential integral rotary knife control