Inventor:Kingham; David R.
No. of patents:1
||Title Of Patent
||Method and apparatus for surface analysis
||September 8, 1992|
|Method and apparatus for analyzing organic material present in a surface region (5) of a sample (1), the apparatus comprising: an evacuable sample receiving chamber (2); means (3) for generating an energetic beam (4) of particles or photons and for directing the beam onto the sample wher|