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Imi; Satoshi
Kanagawa-ken, JP
No. of patents:

Patent Number Title Of Patent Date Issued
8300923 Process control method, data registration program, and method for manufacturing electronic devic October 30, 2012
A process control method and data registration program for a surface mount line includes retrieving printing quality data, mounting quality data, and soldering pass/fail data from a primary recorder, recording the printing quality data, the mounting quality data, and the soldering pa
8131060 Process control method, data registration program, and method for manufacturing electronic devic March 6, 2012
A process control method is provided for a surface mount line including a solder printer for printing solder on a surface of a substrate, a solder print inspector for inspecting the printed solder and outputting printing quality data, a mounter for mounting components on the substrate wi
7477773 Method for inspecting a pattern and method for manufacturing a semiconductor chip having a circu January 13, 2009
A method for inspecting a pattern includes measuring, in a first direction, a width of a reference pattern at plural positions in the reference patter; measuring, in a second direction, a width of the reference pattern at the plural positions. Comparing the first and second width and

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