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Inventor:
Hou; Wenmei
Address:
Bern, CH
No. of patents:
1
Patents:












Patent Number Title Of Patent Date Issued
5331400 Heterodyne interferometer arrangement July 19, 1994
A heterodyne interferometer arrangement comprises a two-frequency light source, an optical reference branch for producing a reference signal, an optical measuring branch, which includes an interferometer unit causing a phase rotation of the light beams in response to a length to be measu










 
 
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