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Inventor:
Hayhow; Reid
Address:
La Porte, CO
No. of patents:
12
Patents:




Patent Number Title Of Patent Date Issued
7617503 Method and apparatus for determining which of two computer processes should perform a function X November 10, 2009
In one embodiment, a method for determining which of two computer processes should perform a function X includes the following actions. If a second computer process is dependent on data received at a first computer process, it is determined whether the second computer process current
7581148 System, method and apparatus for completing the generation of test records after an abort event August 25, 2009
A system for formatting test data includes at least one data formatter to retrieve test data from a data store, upon receiving notifications of test events, and to generate a number of test records based on the test data. The system further includes an abort handler to cause at least one
7555639 Method for configuring a data formatting process using configuration values of a highest priorit June 30, 2009
In one embodiment, one or more data structures that define associations between a plurality of configuration keys and a plurality of configuration values are accessed, and a highest priority configuration value is retrieved for each of the plurality of configuration keys. The configu
7519887 Apparatus for storing and formatting data April 14, 2009
In one embodiment, apparatus includes a data populator that is provided to 1) receive a plurality of events, 2) create a plurality of data objects in memory, with at least some of the data objects corresponding to logical groupings of data implied by ones of the events, 3) relate data
7421360 Method and apparatus for handling a user-defined event that is generated during test of a device September 2, 2008
In one embodiment, and in response to an ordered sequence of events corresponding to execution of a plurality of tests on at least one device under test (DUT), 1) a plurality of data objects are created, the data objects including A) some data objects that correspond to logical group
7415479 Method and apparatus for assigning test numbers August 19, 2008
In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. Upon execution of a subtest in the testflow, a database of test numbers is indexed using index information comprising 1) an identifier of the subtest, and 2) the
7373360 Methods and apparatus that use contextual test number factors to assign test numbers May 13, 2008
In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are used to determine
7321967 System and method for configuring capabilities of printed circuit boards January 22, 2008
Methods for configuring the capabilities of electronic systems containing printed circuit boards are provided. One such method comprises: providing an initial configuration describing a first set of capabilities corresponding to each PCB as currently configured; modifying the initial
7181358 Method, apparatus and database using a map of linked data nodes for storing test numbers February 20, 2007
In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. The information is maintained as an array of one or more context values. Upon execution of a subtest in the testflow, a map of linked data nodes is indexed using
7076388 Methods and apparatus for handling test number collisions July 11, 2006
Apparatus for handling test number collisions comprises program code stored on computer readable media. The code, in response to a collision between first and second test numbers, automatically adjusts the second test number in response to a collision tracking value associated with the
7031867 Methods and apparatus for identifying test number collisions April 18, 2006
In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. Upon generation of a new test number for a result of a subtest in the testflow, a database of test numbers is indexed using the new test number. If the new t
7024322 Dynamic waveform resource management April 4, 2006
A dynamic waveform manager and an application policy are provided to an electronic device that executes an application requiring the use of waveforms accessed from a waveform table characterized by a limited number of entries. The application policy contains waveform sequencing infor


 
 
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