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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Grundy; David C.
Address:
Reading, MA
No. of patents:
15
Patents:




Patent Number Title Of Patent Date Issued
7533575 Quasistatic magnetic and electric field stress/strain gages May 19, 2009
Magnetic or electric field sensors are mounted against a material surface and used for stress, strain, and load monitoring of rotating components such as vehicle drive trains. The stationary sensors are mounted at multiple locations around the component and used assess the stress on the
7528598 Fastener and fitting based sensing methods May 5, 2009
Damage and usage conditions in the vicinity of fasteners in joined structures are nondestructively evaluated using the fasteners themselves. Sensors or sensor conductors are embedded in the fasteners or integrated within the fastener construct, either in the clearance gap between the
7526964 Applied and residual stress measurements using magnetic field sensors May 5, 2009
Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for
7518360 Hybrid wound/etched winding constructs for scanning and monitoring April 14, 2009
Combined wound and micro-fabricated winding constructs are described for the inspection of materials and the detection and characterization of hidden features or flaws. These constructs can be configured as sensors or sensor arrays that are surface mounted or scanned over conducting
7451657 Material condition monitoring with multiple sensing modes November 18, 2008
Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially ch
7280940 Segmented field dielectric sensor array for material characterization October 9, 2007
The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors
7188532 Self-monitoring metals, alloys and materials March 13, 2007
Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such
7183764 Method for inspecting a channel using a flexible sensor February 27, 2007
Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the b
7161351 Hidden feature characterization using a database of sensor responses January 9, 2007
Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown m
7106055 Fabrication of samples having predetermined material conditions September 12, 2006
Fabrication of samples having material conditions or damage representative of actual components inspected by nondestructive testing involves sensors placed near or mounted on the material surface, such as flexible eddy current sensors or sensor arrays, to monitor the material condition w
7095224 Process control and damage monitoring August 22, 2006
A process control method is described which uses measurements from magnetic field sensors to monitor the condition of material, such as from a heat treatment process. The sensors can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, m
7049811 Test circuit having parallel drive segments and a plurality of sense elements May 23, 2006
A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field i
6995557 High resolution inductive sensor arrays for material and defect characterization of welds February 7, 2006
A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended p
6784662 Eddy current sensor arrays having drive windings with extended portions August 31, 2004
An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing e
6727691 High resolution inductive sensor arrays for material and defect characterization of welds April 27, 2004
A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended p


 
 
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