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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Giddings; James N.
Address:
Mesquite, TX
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
5596282 Tester for integrated circuits January 21, 1997
The present invention relates to the field of programming, testing, or burn-in integrated circuits. A testing device is disclosed whereby contact with the leads of an integrated circuit is made while the integrated circuit is in the shipping tray. Contact is made from a jig which is
5036221 Circuit for eliminating metastable events associated with a data signal asynchronous to a clock July 30, 1991
A circuit for reducing the metastable events produced by a data signal asynchronous to a system clock signal is provided. The circuit includes an edge detector (32) for detecting a transistion of the data signal. The edge detector (32) controls a clock disable/reenable circuit (46) which










 
 
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