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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Fujii; Dai
Address:
Tokai, JP
No. of patents:
4
Patents:












Patent Number Title Of Patent Date Issued
8036447 Inspection apparatus for inspecting patterns of a substrate October 11, 2011
A pattern inspection apparatus has a setting unit of a plurality of cell areas A and B of different cell comparison pitches and inspects the plurality of cell areas of the different cell comparison pitches in accordance with settings of the setting unit. As information to read out im
7421110 Image processing unit for wafer inspection tool September 2, 2008
An image processing apparatus for wafer inspection tool that is able to perform continuously cell to cell comparison inspection, die to die comparison inspection, and cell-to-cell and die-to-die hybrid comparison inspection, employing a plurality of processors. This image processing
6986029 Micro-controller for reading out compressed instruction code and program memory for compressing January 10, 2006
A micro-controller includes a dictionary memory for storing instruction codes which appear in a program, and a compressed code memory for storing compressed codes each converted from each of the instruction codes included in the program. Each compressed code has a word length suffici
6915413 Micro-controller for reading out compressed instruction code and program memory for compressing July 5, 2005
A micro-controller includes a dictionary memory for storing instruction codes which appear in a program, and a compressed code memory for storing compressed codes each converted from each of the instruction codes included in the program. Each compressed code has a word length suffici










 
 
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