| Patent Number |
Title Of Patent |
Date Issued |
| 5969403 |
Physical fuse for semiconductor integrated circuit |
October 19, 1999 |
| A fuse for an integrated circuit is constituted by a shallow NP junction, covered with a metal contact, the semiconductor region being not excessively doped. For the blowing of the fuse, the junction is forward biased with a current sufficient to enable a diffusion of metal up to the |
| 5665627 |
Method of irreversibly locking a portion of a semiconductor device |
September 9, 1997 |
| A fuse for an integrated circuit is constituted by a shallow NP junction, covered with a metal contact, the semiconductor region being not excessively doped. For the blowing of the fuse, the junction is forward biased with a current sufficient to enable a diffusion of metal up to the |
| 5304861 |
Circuit for the detection of temperature threshold, light and unduly low clock frequency |
April 19, 1994 |
| A detection circuit that does not vary with the supply voltage is formed by measuring the voltage generated at the terminals of a diode (1) which is reverse biased and is supplied by a constant current generator (2). Furthermore, the generator (2) is improved by a current consumption |
| 5291139 |
Circuit for detection of the state of an integrated circuit fuse in a balanced fuse configuratio |
March 1, 1994 |
| A circuit for the detection of a fuse with oxide vertical fusing has another fuse that is of the same type but cannot be blown and, in parallel with each of the fuses, a voltage reference circuit. The output of each of the voltage reference circuits is an input of a differential comparat |
| 5144515 |
Detector of fast variation in the supply of integrated circuits |
September 1, 1992 |
| Some integrated circuits need to be protected against malfunctioning due to the variations in the supply voltage Vcc. A detector of fast variations of the supply voltage is placed in the integrated circuit to interrupt or modify all or a part of the working of the general integrated circ |
| 4952796 |
Light detection circuit having a junction reverse-biased by a current generator |
August 28, 1990 |
| In a semi-conducting integrated circuit, there is made a light detection circuit, the output signal of which can be used to counter manipulations by dishonest persons who undertake a decapsulation or a removal from the card when the integrated circuit is inserted in a bank type card, or |
| 4932053 |
Safety device against the unauthorized detection of protected data |
June 5, 1990 |
| The disclosure concerns the safety of the confidential information contained in integrated circuits. In a certain number of integrated circuit applications and, more particularly, in the circuits contained in cards known as "chip cards", it is necessary to prohibit access by unauthor |
| 4924212 |
Temperature threshold detection circuit |
May 8, 1990 |
| A threshold temperature detection is made by measuring the reverse saturation current of a transistor subjected to the temperature to be measured. It is shown that, for temperatures close to the ambient temperature, the sensitivity of this detector is very high. Furthermore, in makin |
| 4860258 |
Electrically programmable non-volatile memory having sequentially deactivated write circuits |
August 22, 1989 |
| An electrically programmable non-volatile memory includes a matrix of memory cells accessible by rows and columns, write and read circuits which apply potentials, representing the programmed datum or representing the read command, to the rows and columns. The memory also includes a devic |
| 4835423 |
MOS technology voltage switch-over circuit |
May 30, 1989 |
| A voltage switch-over circuit, depending on a switch-over signal, delivers either a first voltage Vpp or a second voltage Vcc at its output, the voltage Vpp being greater than the voltage Vcc. The said circuit consists of a first MOS transistor with one of its electrodes connected to the |
| 4827451 |
Safety device for the programming of an electrically programmable non-volatile memory |
May 2, 1989 |
| In a memory consisting of a matrix of memory cells, each of which is accessible by rows and columns and is connected to write and read circuits which are used, respectively, to programme them in two states, "1" or "0", depending on the input data, and to read the programmed state, the me |
| 4813024 |
Integrated circuit for the confidential storage and processing of data, comprising a device agai |
March 14, 1989 |
| A fraud-preventive device for a memory card comprising an EPROM type or similar non-volatile memory designed to receive confidential authorization data as well as the results, wrong or otherwise, of tests on the authorization data, comprises a single simulation cell designed to record |
