Inventor:Duggal; Anil R.
No. of patents:1
||Title Of Patent
||Measurement of material properties with optically induced phonons
||May 27, 1997|
|Samples such as thin polymeric films are analyzed using optically induced phonons by excitation of the sample using radiation preferably absorbed by the sample and probe radiation, preferably not absorbed by the sample, that is diffracted from the surface of the sample. The pulse width o|