| Patent Number |
Title Of Patent |
Date Issued |
| 7409669 |
Automatic test configuration generation facilitating repair of programmable circuits |
August 5, 2008 |
| Techniques are provided that control the generation of test routes to improve the ability of a test system to isolate defects on programmable circuits. A test generator creates test routes that test the horizontal resources. In these test routes, the inputs of each circuit element are |
| 7131043 |
Automatic testing for programmable networks of control signals |
October 31, 2006 |
| Techniques are provided for testing routing resources that route control signals on programmable integrated circuits (ICs). Control signals (such as clock signals) are routed through a logic gate to a test register. Values of the control signals are stored in the test register, trans |
| 7111213 |
Failure isolation and repair techniques for integrated circuits |
September 19, 2006 |
| Techniques for isolating and repairing failures on a programmable circuit are provided. An error on programmable circuit may be caused by a defect on the chip. The error is located, and the circuit elements effected by the defect are isolated. By identifying operable circuit elements nea |
| 7062685 |
Techniques for providing early failure warning of a programmable circuit |
June 13, 2006 |
| Techniques for monitoring the performance of a programmable circuit and to provide an early warning of a potential failure are provided. A processor monitors the performance of components on a programmable circuit over time. The processor stores performance characteristics for the compon |
| 7058534 |
Method and apparatus for application specific test of PLDs |
June 6, 2006 |
| Method and apparatus for application specific testing of PLDs. The PLD has a number of resources, less than all of which are used for implementing a customer application. The method includes the following steps. The set of resources that is used for implementing the customer application |
| 7024327 |
Techniques for automatically generating tests for programmable circuits |
April 4, 2006 |
| Programmable circuits have a programmable interconnect structure that connects programmable circuit elements. Tests patterns can be automatically generated for the programmable circuit elements and interconnections on a programmable circuit. A connectivity graph represents programmab |
