Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Bynum; Timothy J. A.
Address:
Glen Allen, VA
No. of patents:
1
Patents:












Patent Number Title Of Patent Date Issued
7415387 Die and wafer failure classification system and method August 19, 2008
A system and method for classifying failures of semiconductor integrated circuit dies using a unique input vector created from die level characterization data to classify wafer (process related) and die level (defect related) patterns. The failure classification may then be used to a










 
 
  Recently Added Patents
Electronic package with fluid flow barriers
Predictive time entry for workforce management systems
Image processing apparatus, remote management system, license update method, and computer program product
Area reduction for surface mount package chips
Plants and seeds of hybrid corn variety CH717591
Multi-band dipole antenna
Maize variety X00C175
  Randomly Featured Patents
Vehicle mounted ladder
Fiber optic light source having a dual characteristic fan
Radiolabeled amine compounds and their use
Locking assembly for hydrokinetic device suitable for automobile transmission
Multimedia structure and method for browsing multimedia with defined priority of multimedia segments and semantic elements
Magnetically-coupled double-sided window washer
Method and apparatus for sealing and cementing a wellbore
Method for producing 2,3,4,5-tetrachlorobenzotrifluoride
Process for the manufacture of integrated devices with gate oxide protection from manufacturing process damage, and protection structure therefor
Apparatus and method for automatically starting and stopping a vehicle engine to effect a smooth change from a vehicle brake release state to a vehicle drive state