Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Bynum; Timothy J. A.
Address:
Glen Allen, VA
No. of patents:
1
Patents:












Patent Number Title Of Patent Date Issued
7415387 Die and wafer failure classification system and method August 19, 2008
A system and method for classifying failures of semiconductor integrated circuit dies using a unique input vector created from die level characterization data to classify wafer (process related) and die level (defect related) patterns. The failure classification may then be used to a










 
 
  Recently Added Patents
Refuelable battery-powered electric vehicle
Transaction cost recovery queue management
Emergency call notification for network services
Method and apparatus for monitoring for a radio link failure
Intelligent and automated code deployment
Single-pass Barankin Estimation of scatterer height from SAR data
Systems and methods for selective text to speech synthesis
  Randomly Featured Patents
Apparatus and method for depositing a substance with temperature control
Turbine leaf seal mounting with headless pins
Chain transfer agents and its use in polymer synthesis
Electronic circuit for piezoelectric switch assembly
Method and apparatus for exercising and debugging correlations for network security system
Toy construction kit
Thin film tantalum oxide capacitor
Fluid catalyst regeneration process
Planter
Signal controller