| Patent Number |
Title Of Patent |
Date Issued |
| 5695155 |
Resonator-based, surface-condition sensor |
December 9, 1997 |
| A sensor is provided for detecting the presence of dielectric media, e.g., ice. The sensor includes a plurality of microstrip resonators which are positioned for electromagnetic coupling with a microstrip transmission line. The resonators produce amplitude minima in a radio-frequency sig |
| 5668442 |
Plasma-assisted tube with helical slow-wave structure |
September 16, 1997 |
| Microwave amplifiers are disclosed having a hollow helix slow-wave structure coupled directly to input and output waveguides. This helix-waveguide coupling structure couples the TEM mode of the helix to the TE10 mode of the rectangular waveguides and also defines ports communicating |
| 5652522 |
Dielectric-loaded surface-condition sensor and method |
July 29, 1997 |
| A dielectric-loaded, microwave sensor which can detect dielectric coatings, e.g., air, water and ice, on a road surface. The sensor includes an antenna having an aperture and also includes a dielectric member with a lower surface and an upper surface. The dielectric member is arranged wi |
| 5525864 |
RF source including slow wave tube with lateral outlet ports |
June 11, 1996 |
| Multiple radio frequency (RF) outlet ports are provided along the side of a slow wave tube to establish a distributed RF output in response to the transmission of an e.sup.- beam through the tube. The tube has a periodically rippled inner surface, and the outlet ports are spaced along |
| 5523651 |
Plasma wave tube amplifier/primed oscillator |
June 4, 1996 |
| Plasma wave tubes are disclosed having waveguide injection systems configured for injection of an RF signal to prebunch the electron beam of the tube and thereby control the frequency of an RF output signal. Preferred embodiments of the injection system include a plurality of rectang |
| 5497100 |
Surface condition sensing system |
March 5, 1996 |
| A surface condition sensing system includes a frequency controlled source of electromagnetic power adapted to produce a band of selected frequencies which are directed to a surface under examination. A monitoring circuit compares transmitted and reflected electromagnetic power as a funct |
