| Patent Number |
Title Of Patent |
Date Issued |
| 7494340 |
Extensible exam language (XXL) protocol for computer based testing |
February 24, 2009 |
| A memory stores a plurality of first data structures, which includes element specific data objects indicating a classification of at least one of the plurality of segments of the test definition language, and second data structures, which include attribute specific data objects indicatin |
| 7318727 |
Method and system for computer based testing using a non-deterministic exam extensible language |
January 15, 2008 |
| A system for computer-based testing for producing a test and delivering the test to an examinee includes a test driver that has an executable code that controls the test driver, a storage device that has a plurality of storage locations, which store the test definition language as a |
| 7080303 |
Method and system for computer based testing using plugins to expand functionality of a test dri |
July 18, 2006 |
| A method and/or system for computer-based testing includes, for example, instantiating an expansion module, and providing to the expansion module a resource storage element within a resource file. The method and/or system also includes, for example loading information from the resource |
| 6966048 |
Method and system for computer based testing using a non-deterministic exam extensible language |
November 15, 2005 |
| A system for computer-based testing for producing and delivering a test to an examinee includes a test driver, a storage device that stores the test definition language as a plurality of segments, and a validation expansion module that validates the plurality of segments of the test defi |
| 6948153 |
Method and system for computer based testing using an amalgamated resource file |
September 20, 2005 |
| A system for computer-based testing for producing a test and delivering the test to an examinee includes a storage device that has a first storage location, which stores a first segment of a test definition language, and a second storage location, which stores a second segment of the tes |
