| Patent Number |
Title Of Patent |
Date Issued |
| 6588995 |
Method and apparatus for aligning keys for cutting |
July 8, 2003 |
| An apparatus and method for determining a bitting pattern of a key comprising a housing used for optically outlining at least the profile of the blade of the key so as to form an image. The image is digitized and information created therefrom, including information about the width of |
| 6064747 |
Method and apparatus for using light to identify a key |
May 16, 2000 |
| An apparatus and method for identifying a key using a housing having a support that allows light to pass therethrough adjacent the key, a light source for emitting light through at least a portion of the support so as to form a first image of at least a portion of the profile of the key, |
| 5444535 |
High signal-to-noise optical apparatus and method for glass bottle thread damage detection |
August 22, 1995 |
| An optical photodetection apparatus for glass surface defect photodetection includes a source for directing light, as an incident beam thereof against a glass surface target, which source is selected to emit light at wavelengths substantially overlapping a target-glass-absorbed bandwidth |
| 4588293 |
Method and apparatus for inspecting photomasks to detect defects |
May 13, 1986 |
| The present invention is directed to an improved method and apparatus for detecting defects in photomasks containing features with different arbitrary orientations, said apparatus including in one form therof a detector for detecting orientations of the features so that the optical s |
| 4448503 |
Automatic high speed microfilm searching system |
May 15, 1984 |
| An automatic high speed microfilm searching system is disclosed for locating a desired frame of microfilm. Each frame consists of information data and index data. The index data comprises a sequence of vertically-aligned data bar groups, each representing a half character of a sequen |
| 4019050 |
Optical inspection system |
April 19, 1977 |
| An optical inspection system is adapted to provide a null when an inspected object is of prescribed geometry. An optical beam forms an image of the object to be inspected and detectors are placed in pairs at like positions, dictated by the symmetry of the image, to exhibit like signals |
