Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Akashi; Teruhisa
Address:
Ishioka, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7119362 Method of manufacturing semiconductor apparatus October 10, 2006
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing
6511857 Process for manufacturing semiconductor device January 28, 2003
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing










 
 
  Recently Added Patents
Solid-state imaging device and method for manufacturing the same
Print system
Stabilized redispersible polymer powder compositions
Apparatus and method for evaluating an activity distribution, and irradiation system
Method and apparatus for controllable communication
Lithographic apparatus and device manufacturing method
Content display system
  Randomly Featured Patents
Pre-allocated random access identifiers
Remote controller for hinged window
Article with holographic and retroreflective features
Bar-code optical scanner
Liquid detergent of reduced color fading
Fiber optic audio cable
Journal case
Communications apparatus and communications system using multicarrier transmission mode
Method of and apparatus for cutting material to shape from a moving web by burning
Impact transmitter for reciprocating machines