Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Akashi; Teruhisa
Address:
Ishioka, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7119362 Method of manufacturing semiconductor apparatus October 10, 2006
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing
6511857 Process for manufacturing semiconductor device January 28, 2003
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing










 
 
  Recently Added Patents
Image forming apparatus, control method and computer-readable medium for stopping a print job during printing by a printer
Processor micro-architecture for compute, save or restore multiple registers, devices, systems, methods and processes of manufacture
Vibration disturbance estimation and control
Partial response decision feedback equalizer with distributed control
Container
Ottoman
Exposure apparatus, exposure method, and device manufacturing method
  Randomly Featured Patents
Alcohol breath testing device
Process for the continuous polymerization of polyblends
Multi-beam, high efficiency diffractive optics system formed in a single substrate
Current detector
Manipulation of neuronal ion channels
Dual priority switching apparatus for simplex networks
Incident analysis and solution system
Fume ventilation apparatus
Insertion of supplemental burst into video signals to thwart piracy and/or carry data
Tone generator for PAM/TDM telecommunication system