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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Akashi; Teruhisa
Address:
Ishioka, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7119362 Method of manufacturing semiconductor apparatus October 10, 2006
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing
6511857 Process for manufacturing semiconductor device January 28, 2003
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing










 
 
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