Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Akashi; Teruhisa
Address:
Ishioka, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7119362 Method of manufacturing semiconductor apparatus October 10, 2006
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing
6511857 Process for manufacturing semiconductor device January 28, 2003
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing










 
 
  Recently Added Patents
Patient interface
Dual gate electronic memory cell and device with dual gate electronic memory cells
Communication system and data transmission method thereof
Vertical axis wind turbines
Apparatus for preventing overcharge of a battery
Movable assemblies for an image reader unit and a cover unit in an image formation apparatus
Authenticating messages sent between a vehicle and a central facility
  Randomly Featured Patents
Ribbon bookmark
Dynamic pricing of items based on category with which the item is associated
Rotary wire stripper
Application and method for benchmarking a database server
Semiconductor device having both memory and logic circuit and its manufacture
System for simulating the conveyance of a flexible medium
Method for determining if an encrypted flow of packets belongs to a predefined class of flows
Methods and apparatuses for sharing user profiles
Gathering-stitching machine having a guide element in the stitching region
Laundry method imparting soil release properties to laundered fabrics