Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Akashi; Teruhisa
Address:
Ishioka, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7119362 Method of manufacturing semiconductor apparatus October 10, 2006
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing
6511857 Process for manufacturing semiconductor device January 28, 2003
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing










 
 
  Recently Added Patents
Method to improve washer motor efficiency and performance
Sulfonyl semicarbazides, semicarbazides and ureas, pharmaceutical compositions thereof, and methods for treating hemorrhagic fever viruses, including infections associated with arena viruses
Coupling device for transmitting torque
Checking an ESD behavior of integrated circuits on the circuit level
Bis-aryl sulfonamides
Spindle motor and disk drive apparatus
Driving assisting device
  Randomly Featured Patents
Vehicular lamp
Method and means for internal inspection and sorting of produce
Extruder for extruding pasta in the form of a thin continuous strip
Sustained-release preparation
Cationic polymer flocculant
Flexible high thermomechanical stress-resistant and fireproof halogen-free thermoplastic compositions
Fastener feeder with fastener size screening
Reflection Photomask
High aspect ratio P-N junctions by the thermal gradient zone melting technique
Solenoid valve