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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Abe; Takao
Address:
Gunma-ken, JP
No. of patents:
3
Patents:




Patent Number Title Of Patent Date Issued
6583029 Production method for silicon wafer and SOI wafer, and SOI wafer June 24, 2003
There are provided a method for manufacturing a mirror polished wafer with little polishing sag (peripheral sag) by a relatively easy method, a method for manufacturing a bonded wafer having an SOI layer or a bond layer which has no periphery removing region or reduces it, and a bonded
6551398 Heat treatment method for a silicon monocrystal wafer and a silicon monocrystal wafer April 22, 2003
There is disclosed a heat treatment method for a silicon monocrystal wafer comprising the steps of heat-treating in a reducing atmosphere a silicon monocrystal wafer manufactured by growing a silicon monocrystal ingot by Czochralski method wherein a wafer obtained from a silicon monocrys
6403502 Heat treatment method for a silicon wafer and a silicon wafer heat-treated by the method June 11, 2002
There is disclosed a heat treatment method for a silicon wafer in which the silicon wafer is heat treated in a reducing atmosphere through use of a rapid heating/rapid cooling apparatus. The silicon wafer is heat treated for a period of 1 to 60 seconds at a temperature in the range of


 
 
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