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Inventor: Abe; Mitsuhiro
Address: Kanagawa-ken, JP
No. of patents: 1
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 6731561 |
Semiconductor memory and method of testing semiconductor memory |
May 4, 2004 |
| A semiconductor memory includes a group of memory cells arrayed in a matrix, memory cell electric power source lines configured to connect the respective memory cells arrayed in a direction of rows of the group of memory cells of each of the rows, two electric power source terminals |
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