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Abe; Masayuki
Osaka, JP
No. of patents:

Patent Number Title Of Patent Date Issued
7703314 Probe position control system and method April 27, 2010
The present invention provides a technique for eliminating the effect of the thermal drift and other variances and to improve the observing or manipulating accuracy of a scanning probe microscope or atom manipulator by using the technique to correct the aforementioned change in the r

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