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Inventor:
Abdennadher; Salem
Address:
Sacramento, CA
No. of patents:
6
Patents:




Patent Number Title Of Patent Date Issued
7409621 On-chip jitter testing August 5, 2008
On-chip jitter testing includes providing a clock signal to a circuit under test and delaying outputs from the circuit under test by predetermined delay values. For each delay value, a corresponding output from the circuit under test is compared with a reference signal derived from t
7088091 Testing a multi-channel device August 8, 2006
In one embodiment, a method includes routing first test data from a first channel of a device to a second channel of the device, and outputting the first test data from the second channel. The device, in one embodiment, may be a mixed signal device and the test data may be alternating cu
6868534 Circuit modeling March 15, 2005
Modeling a circuit includes producing a first behavioral model of a circuit based on a transistor model of the circuit. A second behavioral model is produced of a noise source coupled to the circuit based on the first behavioral model and based on a transistor model of the noise source.
6836872 On-chip testing of integrated circuits December 28, 2004
A method comprises inserting into a behavioral model of an integrated circuit component a corresponding built-in self-test structure from a library of built-in self-test structures that correspond to integrated circuit components and using the behavioral model to verify whether the i
6777921 Analog filter with built-in self test August 17, 2004
An analog filter in an integrated circuit is tested by placing the filter in a feedback loop. The filter is tested by determining whether the analog filter, while in the feedback loop, provides a signal that oscillates within a predetermined tolerance of an expected frequency.
6670800 Timing variation measurements December 30, 2003
Measuring timing variations in a periodic signal includes producing trigger signals in an integrated circuit in response an externally-generated periodic signal. First and second oscillation signals are generated in response to the trigger signals. A first count of the number of pulses i


 
 
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