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Inventor: Abdalla; Wafaa
Address: San Jose, CA
No. of patents: 2
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 7623427 |
Surface inspection by amplitude modulated specular light detection |
November 24, 2009 |
| An apparatus for detecting defects on a disk surface includes a light source that generates a light beam and a beamsplitter that splits the light beam into a first light beam portion and a second light beam portion. The first light beam portion illuminates the surface of the disk and |
| 7554670 |
Surface inspection by double pass laser doppler vibrometry |
June 30, 2009 |
| A double pass apparatus for detecting defects on a disk surface includes a light source that generates a light beam and a beamsplitter that splits the light beam into a first light beam portion and a second light beam portion. A modulator is provided that modulates the second light beam |
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