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Inventor: Abarcrombie; David A.
Address: Gresham, OR
No. of patents: 1
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 7013192 |
Substrate contact analysis |
March 14, 2006 |
| A method of analyzing substrate yield, where a substrate yield map and a substrate contact map are selected and overlaid to produce a composite map. First elements of the substrate yield map are compared to second elements of the substrate contact map to determine a degree of correla |
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