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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Abarcrombie; David A.
Address:
Gresham, OR
No. of patents:
1
Patents:




Patent Number Title Of Patent Date Issued
7013192 Substrate contact analysis March 14, 2006
A method of analyzing substrate yield, where a substrate yield map and a substrate contact map are selected and overlaid to produce a composite map. First elements of the substrate yield map are compared to second elements of the substrate contact map to determine a degree of correla


 
 
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