Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Particle beam systems and methods










Image Number 6 for United States Patent #8450215.

An inspection method comprises focusing a particle beam onto a sample; operating at least one detector located close to the sample; assigning detection signals generated by the at least one detector to different intensity intervals; determining, based on the detection signals assigned to the intensity intervals, at least one first signal component related to electrons incident on the detector; and determining, based on the detection signals assigned to the intensity intervals, at least one second signal component related to X-rays incident on the detector.








 
 
  Recently Added Patents
Systems and methods of using dynamic data for wear leveling in solid-state devices
Undercabinet plug-in mount
Implantable defibrillator systems and methods with mitigations for saturation avoidance and accommodation
(4926
Document layout method
Power consumption management in a MIMO transceiver and method for use therewith
Sequential control device for a striking mechanism
  Randomly Featured Patents
Decontamination formulations
Retainer element for a securing element used to maintain a crank handle on a fishing reel
Tortilla and method of manufacture
Electrical circuits
Fitted mattress pad and method of forming a fitted mattress pad
Turbine blade
Synthetic grip for a handgun handle and method of installation
Organic light emitting display apparatus and method of manufacturing the same
Semi-automatic firearm
System and method for global motion estimation using profile matching