Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Particle beam systems and methods










Image Number 5 for United States Patent #8450215.

An inspection method comprises focusing a particle beam onto a sample; operating at least one detector located close to the sample; assigning detection signals generated by the at least one detector to different intensity intervals; determining, based on the detection signals assigned to the intensity intervals, at least one first signal component related to electrons incident on the detector; and determining, based on the detection signals assigned to the intensity intervals, at least one second signal component related to X-rays incident on the detector.








 
 
  Recently Added Patents
Manipulation of an alternative respiratory pathway in photo-autotrophs
Secondary battery pack including insulative mounting member into which PCM is inserted in lateral direction
Polarization-coupled ferroelectric unipolar junction memory and energy storage device
Method and system and policy server for guaranteeing data not to be interrupted
Classifying documents using multiple classifiers
Power supply input voltage detection circuit
Method of fabricating semiconductor light emitting device
  Randomly Featured Patents
Liquid-filled anti-vibration mounting device
Bias generator for low ground bounce output driver
Roller coaster vehicle
Knife blade
Systems for treating a hollow anatomical structure
Positioning method and positioning structure of inhibitor switch
Motor driving circuit using a PWM input signal
Fan housing with noise-reducing structure
Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system
Method of controlling a reclamation furnace