Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Use of emerging non-volatile memory elements with flash memory
Lead with lead stiffener for implantable electrical stimulation systems and methods of making and using
Lipoprotein analysis by differential charged-particle mobility
Wine cellar alarm system
Field device for determining or monitoring a physical or chemical process variable
Systems and methods to provide report part via a web service
Wall flow type exhaust gas purification filter
  Randomly Featured Patents
Shipping container
Connector with a terminal locking block
Golf putter head cover
Interlayer stripline transition
Automatic focusing apparatus for a video camera
Methods of forming trenched isolation regions
Chip collector and face milling cutter
Electronic component and method for manufacturing the same
Method and system to manufacture oriented internal and external gear teeth
Method and system for preparing an employee benefits plan