Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Non-uniform image defect inspection method










Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.








 
 
  Recently Added Patents
System and method for leveraging independent innovation in entertainment content and graphics hardware
Synthetic bone grafts
Electronic device and printed circuit board
Audiovisual multi-room support
Methods of establishing virtual circuits and of providing a virtual private network service through a shared network, and provider edge device for such network
Real-time RSL monitoring in a web-based application
System and method for detecting malicious code executed by virtual machine
  Randomly Featured Patents
Technique for obtaining information and services over a communication network
Grip training device
Real time scanning optical macroscope
Universal power adapter/converter
Process for preparing self-healing composite materials of high efficiency for structural applications
1-H-3-aryl-pyrrolidine-2, 4-dione derivatives as pest-control agents
Laser endoscope
Optical information recording and reproducing apparatus
Pinless jack
Terrain avoidance method and system for an aircraft