Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Semiconductor light-receiving device
Systems and methods for updating a data store using a transaction store
Systems and methods for determining muscle force through dynamic gain optimization of a muscle PID controller for designing a replacement prosthetic joint
Image processing apparatus and image processing method
Automated difference recognition between speaking sounds and music
Packaging sleeve
Auto-provisioning of network services over an Ethernet access link
  Randomly Featured Patents
In-circuit programming of output voltage and output current characteristics of a PSR power supply
Conveying arrangement for processing printed products
Webbing guide apparatus
Device and method for displaying track characteristics
Expandable sorter assembly
Machine unit having retaining device using static electricity
Pad conditioner coupling and end effector for a chemical mechanical planarization system and method therfor
Liquid crystal display and base structure thereof
Synchronous rectifier package for high-efficiency operation