Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Surface emitting laser device, surface emitting laser array, optical scanning device, and image forming apparatus
Image forming apparatus, image forming method, and computer readable medium for identifying target-recording element using detection pattern
Landscape post for solar and other light fixtures
Single well reservoir characterization apparatus and methods
Method of forming micropattern, method of forming damascene metallization, and semiconductor device and semiconductor memory device fabricated using the same
Cable exit trough with insert
Method and apparatus for supporting HARQ
  Randomly Featured Patents
Aminotetrazole derivatives useful as nitric oxide synthase inhibitors
Scanning optical system
Copy protection through symbol substitution and induced errors
Transthoracic drug delivery device
Remote control system and method for personal video recorder
Cloud services layer
Signal transfer circuit
Aerodynamic guiding arrangements for vehicles
Process for oxidizing halopyridines to halopyridine-N-oxides
Composite optical amplifier