Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Methods and compositions for improving photodynamic therapy through administration of lipids
Method for transitioning between Ziegler-Natta and metallocene catalysts in a bulk loop reactor for the production of polypropylene
Optical recording medium, and method for producing optical recording medium
Probe for ultrasound diagnostic apparatus
Image forming apparatus with an improved density adjustment unit
Wire guide
Food-grade flour from dry fractionated corn germ and collet composition and method for producing same
  Randomly Featured Patents
Antifreeze compositions
Device and method for removal of rust and paint
Beam form and slab form adjustment structure
Multipole ion guide for mass spectrometry
Sliding hitch-ball holder and guide rack assembly
Microphotonic acousto-optic tunable laser
Catamenial bandage
Heat treatment method wherein the substrate holder is composed of two holder constituting bodies that move relative to each other
Covered storage funnel
Hand-held mixer