Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Method for counting and segmenting viral particles in an image
Face recognition through face building from two or more partial face images from the same face
Display control device, display control method, and touchpad input system
Off-loading of processing from a processor blade to storage blades based on processing activity, availability of cache, and other status indicators
Method and apparatus for complementing an instrument panel by utilizing augmented reality
Subband SNR correction in a frequency selective scheduler
Method and apparatus for efficiently inserting fills in an integrated circuit layout
  Randomly Featured Patents
Asymmetric synthesis catalyzed by transition metal complexes with chiral ligands
Torque limiting vise for holding work on a machine tool table
Combination telephone set and security panel monitor
Photo expansion gas detector
Blocking device for use in a sewer manhole
Duobinary optical transmitter
Lighting device, relay connector, display device and television receiver
Disk drive having a high performance access mode and a lower performance archive mode
Method of grafting a polymer to filler materials
Water drip device for irrigation