Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Non-uniform image defect inspection method










Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.








 
 
  Recently Added Patents
Phenethanolamine derivatives for treatment of respiratory diseases
Image processing apparatus, image processing method, and program
Frothable aqueous composition for use in a carpet backing composition
Identifying multi-component carrier cells
Tomlinson Harashima precoding with additional receiver processing in a multi-user multiple-input multiple-output wireless transmission system
Method for detecting directions of regularity in a two-dimensional image
Monitoring and correcting upstream packet loss
  Randomly Featured Patents
Roll cleaning device
Toner hopper for laser printers
Apparatus and methods for removing unwanted components from a communications signal
Method for mixing liquid media having different specific weights
Apparatus and method for adjusting the threshold voltage of MOS transistors
Dynamic synchronization of tables
Method of manufacturing automotive trim using vibration welding, and resulting article
Adapter for use with a funnel
Vapor type printer apparatus using a detachable cartridge
Nuclear fuel rod having concave weld across pressurization hole in end plug