Resources Contact Us Home
Non-uniform image defect inspection method

Image Number 8 for United States Patent #8145008.

A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.

  Recently Added Patents
Analysis of stress impact on transistor performance
Canopy light fixture
Passive charge cord release system for an electric vehicle
Advocate for facilitating verification for the online presence of an entity
Automatic detection of image degradation in enhanced vision systems
Wind farm, wind power plant in a wind farm and operating control for this purpose
Semiconductor device and method of manufacturing the same
  Randomly Featured Patents
Method for pre-heating, transforming and melting a metal charge and relative plant
Neodymium-doped gehlenite crystal and laser using said crystal
Citrus fruit processing and food product
Golf tee with encapsulated sheet substrate
Penis extension with harness
Method and apparatus for back facet monitoring of laser diode power output
Method and apparatus for concurrently accessing multiple memories with different timing requirements
Nitrogen oxide analyzer and method for setting parameter applied to nitrogen oxide analyzer