Resources Contact Us Home
On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes

Image Number 10 for United States Patent #8134707.

A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is directed onto optically active samples that are disposed in the channels. The incident laser beam interacts with the optically active molecules in the sample, which slightly alter the polarization of the laser beam as it passes multiple times through the sample. Interference fringe patterns (28) are generated by the interaction of the laser beam with the sample and the channel walls. A photodetector (34) is positioned to receive the interference fringe patterns and generate an output signal that is input to a computer or other analyzer (38) for analyzing the signal and determining the rotation of plane polarized light by optically active material in the channel from polarization rotation calculations.

  Recently Added Patents
Adhering composition and method of applying the same
Method for conformal plasma immersed ion implantation assisted by atomic layer deposition
Adaptive block pre-fetching method and system
Method for using a super-slippery thin layer characterized by the method for making same
Semiconductor memory device
Categorization of design rule errors
Endotracheal tube
  Randomly Featured Patents
Method of treating cytokine mediated diseases or conditions
Falling film evaporator
Quaternary pyrazinium compounds
System and method for creation and maintenance of a rich content or content-centric electronic catalog
Parallelogram counter
Center lifting device
Manufacture of hydrogen sulfide
Semiconductor device with ESD protection
Antenna device with improved channel isolation