Resources Contact Us Home
On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes

Image Number 10 for United States Patent #8134707.

A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is directed onto optically active samples that are disposed in the channels. The incident laser beam interacts with the optically active molecules in the sample, which slightly alter the polarization of the laser beam as it passes multiple times through the sample. Interference fringe patterns (28) are generated by the interaction of the laser beam with the sample and the channel walls. A photodetector (34) is positioned to receive the interference fringe patterns and generate an output signal that is input to a computer or other analyzer (38) for analyzing the signal and determining the rotation of plane polarized light by optically active material in the channel from polarization rotation calculations.

  Recently Added Patents
Constant low-flow air source control system and method
Backlight assembly, method for driving backlight assembly, and liquid crystal display having the same
Device and method for adjusting a chrominance signal based on an edge strength
Adaptive switch mode LED system
Performance venue with dynamic mechanical load management system and method
DNA promoters and anthrax vaccines
  Randomly Featured Patents
Bobbin winding machine
Molded surface of a concrete product
Fire protection systems
Shock absorber for use in lowering aircraft landing gear
System and method of wavelength add/drop multiplexing having client configurability
Small-sized motor
Reservoir device for intraocular drug delivery
Pear tree
Iontophoresis device