Resources Contact Us Home
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic

Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

  Recently Added Patents
Method and apparatus for re-routing calls in a packet network during failures
Selection of a suitable node to host a virtual machine in an environment containing a large number of nodes
Power storage device and method for manufacturing the same
Method of allocating IP address of image forming apparatus using DHCP, image forming apparatus and system of allocating IP address using DHCP
Wake-up radio system
Battery loading and unloading mechanism
Data processor and scanner device
  Randomly Featured Patents
Strip casting apparatus
Communications system and communication method
Film bulk acoustic-wave resonator and method for manufacturing the same
Thermal head driving integrated circuit and thermal head driving circuit using the same
Generalized edit distance for queries
Method for processing heart rate information in a portable computer
CPLD high speed path
Energy storage device
Passenger bus
Selective intaglio inking device with removable cartridge