Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic










Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.








 
 
  Recently Added Patents
Bandpass filter and radio communication module and radio communication device using the same
Fingerprinting apparatus, system, and method
Apparatus and method for providing vehicle data for testing product
Field device for determining or monitoring a physical or chemical process variable
System and method for solving connection violations
Plasmon generator includes three metal layers for thermally-assisted magnetic recording
Compounds for nonsense suppression and methods for their use
  Randomly Featured Patents
Heat exchanger for EGR-gas
Process for distributing an object-oriented program over a plurality of operating system processes of a computer system
System for controlling exhaust emissions produced by an internal combustion engine
Process for the preparation of acid chloride compounds
Label holder
Retractable dilator needle
Telephone
Squelch circuit
Seating system and assembly
Conveyor belt