Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic










Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.








 
 
  Recently Added Patents
Light barrier and method for detecting objects
Portable computer display structures
Post-processing including median filtering of noise suppression gains
NMR, instrumentation, and flow meter/controller continuously detecting MR signals, from continuously flowing sample material
Prevention and treatment of oxidative stress disorders by gluthathione and phase II detoxification enzymes
Cylindrical LED fixture
Method of manufacturing nitride semiconductor and nitride semiconductor element
  Randomly Featured Patents
Carriage latch for a disc drive
Coin container
Mechanical projector with variable leverage device
Method and apparatus for providing telephone billing and authentication over a computer network
Call intercept methods, such as for customer self-support on a mobile device
Method of forming end stops molded on a slide fastener chain and a chain splitting apparatus used therein
Metering valve
Image processing device for correcting signal irregularity, calibration method, imaging device, image processing program, and image processing method
Integrated and active noise control inlet
Electronic commerce using a secure courier system