Resources Contact Us Home
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic

Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

  Recently Added Patents
Generalized AC-DC synchronous rectification techniques for single- and multi-phase systems
Battery pouch sheet edge insulation
Toner cartridge
Campanula plant named `PKMM03`
Calendar integration methods and systems for presentation of events having combined activity and location information
Switchable solvents and methods of use thereof
Mobile computing terminal
  Randomly Featured Patents
Voltage regulator compensation circuit and method
Catalyst and process for sweetening a sour hydrocarbon fraction using dipolar compounds
Ultra-violet liquids disinfection device
Self-loading pistols
Heat dissipating device
Power generation system and method
Bonded composite disk of single-side recorded type, and method and apparatus for producing the same with high thickness accuracy
Method of preventing a decrease in sweetness of thaumatin
Drum magazine for large-caliber ammunition
Athermal package for fiber bragg gratings with compensation for non-linear thermal response