Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic










Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.








 
 
  Recently Added Patents
Model matching for trace link generation
Note tab
Data converter with configurable functions
Dual protocol input device
Asynchronous task execution
Light fitting
Mobile camera localization using depth maps
  Randomly Featured Patents
Washing machine with tilted washing tub
Method for determining an item of travel direction information for a vehicle, and sensor device for a vehicle
Automated mechanism for populating and maintaining data structures in a queueless contact center
Connection structure of linear motor type transport device
Device controller with intracontroller communication capability, conveying system using such controllers for controlling conveying sections and methods related thereto
Impulse response processing device, reverberation applying device and program
Nucleic acids encoding GDP-Fucose pyrophosphorylase
Subscriber identity module (SIM) card holder
Spray cooling system
Substituted pyridoindoles as serotonin agonists and antagonists