Resources Contact Us Home
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic

Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

  Recently Added Patents
Cable exit trough with insert
Semiconductor chip, stack module, and memory card
Managing a packet service call within mobile communications user equipment
Headset, terminal, and method capable of switching headset mode
Reception system including a mechanism countering pulsed interference
Antimony and germanium complexes useful for CVD/ALD of metal thin films
Methods and apparatus for achieving multiple bit rates in passive optical networks
  Randomly Featured Patents
Method and apparatus for an ulnar collateral ligament thumb support
Dual-charge smoke screen shell
Cordset assembly
Heating apparatus for forming laminated plastic
Solid state watch with inertial switch
Zeolite L preparation
Device for operating a gas discharge lamp with reduced average lamp power
Wire EDM with apparatus supporting a workpiece through wall of machining bath
Wrapped demi heel shoe sole
Hearing aid with a flexible shell