Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic










Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.








 
 
  Recently Added Patents
Control service for relational data management
Badge or pin
Video-recording reservation management apparatus, method, program, and system
Content protection apparatus and content encryption and decryption apparatus using white-box encryption table
Satellite mounting poles
Apparatus and method for controlling a tunable matching network in a wireless network
Cell proliferation inhibitor
  Randomly Featured Patents
Milling cutter and milling insert with coolant delivery
Detachable sighting mirror for golf putters
Means and method for nonuniform poling of piezoelectric transducers
Method and apparatus for providing power to a coaxial cable network
Folding desk lamp with an adjustable arm and pivoting head, utilizing light emitting diodes
Halogenated polyimide composition having improved adhesion characteristic and articles obtained therefrom
Quinazolinone derivatives, processes for the preparation thereof and pharmaceutical composition comprising the same
Ink jet recording apparatus having a heat fixing mechanism
Heel binding
Lamp guard