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X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic

Image Number 10 for United States Patent #8130908.

An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

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