Resources Contact Us Home
Devices with faraday cages and internal flexibility sipes

Image Number 15 for United States Patent #8125796.

A computer or microchip comprising an outer chamber and at least one inner chamber inside the outer chamber. The outer chamber and the inner chamber being separated at least in part by an internal sipe, and at least a portion of a surface of the outer chamber forming at least a portion of a surface of the internal sipe. The internal sipe has opposing surfaces that are separate from each other and therefore can move relative to each other, and at least a portion of the opposing surfaces are in contact with each other in a unloaded condition. The outer chamber including a Faraday Cage. A computer, comprising an undiced semiconductor wafer having a multitude of microchips. The multitude of microchips on the wafer forming a plurality of independently functioning computers, each computer having independent communication capabilities.

  Recently Added Patents
Parameter decoding apparatus and parameter decoding method
Detecting mirrors on the web
Method for modeling and analyzing linear time invariant systems with time delays
Shoe bag
Display screen of a mobile terminal or portion thereof with a graphical user interface
Sampling switch circuit that uses correlated level shifting
Apparatus and method for information processing, program, and recording medium
  Randomly Featured Patents
Determination of gas flux using airborne dial lidar
Optical sensor circuit, method of processing output signal of the same, and electronic apparatus
System, method and computer program product for asynchronous mirroring
Stopper for sterile fluid containers
Methods and systems for preserving disk geometry of virtualized data volumes
Butter dispensing device
Apparatus and method for wireless energy and/or data transmission between a source device and at least one target device
Monolithic full-color LED micro-display on an active matrix panel manufactured using flip-chip technology
Optical element having inclined surface
Sample inspection methods, systems and components