Resources Contact Us Home
Quantum efficiency measurement apparatus and quantum efficiency measurement method

Image Number 12 for United States Patent #8119996.

A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.

  Recently Added Patents
Method and apparatus for generating images using a color field sequential display
Alleviation of laser-induced damage in optical materials by suppression of transient color centers formation and control of phonon population
Extreme ultraviolet light generation apparatus
Managing and collaborating with digital content
Scale information for drawing annotations
Compact bus bar assembly, switching device and power distribution system
Real-time virtual endoscopy
  Randomly Featured Patents
Electrical component connector with misalignment compensation
Double hung plastic window frame
Antibodies and diagnostic methods for the diagnosis of pestiviruses
Tool-holder turret with an epicyclic transmission and positioning unit
Catalytic cracking of alkanes
Smart key having portable memory card
Toy tunnel structure
Feature information collecting apparatuses, methods, and programs
Imidocarboxylic acid activators and sulfimidocarboxylic acid activators, processes for their preparation and their use
Acoustic wave based sensor