Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Quantum efficiency measurement apparatus and quantum efficiency measurement method










Image Number 12 for United States Patent #8119996.

A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.








 
 
  Recently Added Patents
Server system and method for discovering digital assets in enterprise information systems
High-resolution ranging and location finding using multicarrier signals
Crowd control barrier II
Group greeting card
Multi-contoured yoga support
Ejection station
Surface emitting laser device, surface emitting laser array, optical scanning device, and image forming apparatus
  Randomly Featured Patents
Organic light-emitting devices using spin-dependent processes
Ballast circuit for reducing striations in a discharge lamp
Wound wire bearing
Semiconductor device
Synchronizing method
Locking data in a database after an operation has begun
Method for forming fine patterns of semiconductor device
Yo-yo having radially anchored cushions
Method and apparatus for processing multipath reflection effects in timing systems
Highly integrated very small aperture terminal (VSAT) apparatus and method