Resources Contact Us Home
Method analyzing threshold voltage distribution in nonvolatile memory

Image Number 10 for United States Patent #8116141.

A distribution analyzing method for a nonvolatile memory device having memory cells exhibiting overlapping first and second threshold voltage distributions includes; detecting a degree of overlap between the first and second threshold voltage distributions by reading data stored in the memory cells and determining read index data from the read data, and estimating a distribution characteristic for at least one of the overlapping threshold voltage distributions using the read index data.

  Recently Added Patents
Optical fixing device and image forming apparatus
Anti-FGFR3 antibodies and methods using same
Vehicle wheel rim protector
Polypeptides having beta-glucosidase activity and beta-xylosidase activity and polynucleotides encoding same
Projection-type video-image display apparatus
Vehicle having power supply apparatus
Optical packet signal transmission device and WDM optical communication network
  Randomly Featured Patents
Upright electrical connector
Endourethral device and method
Vibration wave driven apparatus and vibrator
Capacitively shortened coaxial resonators for nuclear magnetic resonance signal reception
Method for the manufacture of a colored nonfogging article
Welding structure for synthetic resin intake manifold
Reduction of superheating
Packaging of semiconductor circuit in pre-molded plastic package
Simultaneous gasification of coal and pyrolysis of organic solid waste materials
SIP-based network video surveillance system and method