Resources Contact Us Home
Method analyzing threshold voltage distribution in nonvolatile memory

Image Number 10 for United States Patent #8116141.

A distribution analyzing method for a nonvolatile memory device having memory cells exhibiting overlapping first and second threshold voltage distributions includes; detecting a degree of overlap between the first and second threshold voltage distributions by reading data stored in the memory cells and determining read index data from the read data, and estimating a distribution characteristic for at least one of the overlapping threshold voltage distributions using the read index data.

  Recently Added Patents
Simplifying lexicon creation in hybrid duplicate detection and inductive classifier systems
Dimmable LED light fixture having adjustable color temperature
Relative pose estimation of non-overlapping cameras using the motion of subjects in the camera fields of view
Vehicle control apparatus
Apparatus and method for masking a clock signal
Methods for determining decoding order in a MIMO system with successive interference cancellation
  Randomly Featured Patents
Pipetting station apparatus
Pneumatically operable switch unit for monitoring tire pressure
Expander cycle rocket engine with staged combustion and heat exchange
Erect photographic apparatus
Panel turning device
Peroxide containing liquid laundry formulation
Communication apparatus
Optical system for improving the symmetry of the beam emitted from a broad area laser diode
Dictionary based video compression
Dithiocarbamates for treating hydrocarbon recovery operations and industrial waters