Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method analyzing threshold voltage distribution in nonvolatile memory










Image Number 10 for United States Patent #8116141.

A distribution analyzing method for a nonvolatile memory device having memory cells exhibiting overlapping first and second threshold voltage distributions includes; detecting a degree of overlap between the first and second threshold voltage distributions by reading data stored in the memory cells and determining read index data from the read data, and estimating a distribution characteristic for at least one of the overlapping threshold voltage distributions using the read index data.








 
 
  Recently Added Patents
Methods and apparatus to determine impressions using distributed demographic information
Selection of a suitable node to host a virtual machine in an environment containing a large number of nodes
Load balancing in shortest-path-bridging networks
Bluetooth headset
Inhibitor of casein kinase 1delta and casein kinase 1E
Pipette device
Circuit for compressing data and a processor employing same
  Randomly Featured Patents
Drive-on multipurpose trailer configurable for semi-vertical storage
Method for generating primate trophoblasts
Flame retardant polymer systems and polymer compositions
Energy-efficient beam-index displays with programmable power supplies
Non-destructive examination of an article particularly a tire, with ultrasonic energy
Refractive index temperature sensor
Adaptive linear prediction speech synthesizer
Elastic flat-surfaced woven fabric and its manufacture
Surface light-source device and display unit using the same
Systems, methods, and media for outputting a dataset based upon anomaly detection