Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor memory device having mount test circuits and mount test method thereof










Image Number 4 for United States Patent #8108741.

A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory device including a plurality of memory blocks may include a comparison unit for comparing test data of at least two memory blocks selected from the plurality of memory blocks, deciding whether or not the test data of the selected memory blocks are identical, and outputting a pass signal or fail signal as a flag signal; and an output selection unit for selecting any one of the selected memory blocks as an output memory block, and changing the output memory block whenever the fail signal is generated from the comparison unit, thus forming it as a data output path, which may lessen error occurrence.








 
 
  Recently Added Patents
Automated malware detection and remediation
Technique for providing secure network access
Process for hydrogenating alkyl ester(s) in the presence of carbon monoxide
Accumulator
Methods for preparing 2-methoxyisobutylisonitrile and tetrakis(2-methoxyisobutylisonitrile)copper(I) tetrafluoroborate
User interface system
Vibrotactile device and method using the same
  Randomly Featured Patents
Reliability test structure for multilevel interconnect
Multiple layer flexible sheet structure
Process for production of polymer sheet and optical polymer sheet
Method for enlarging a jaw bone using a hollow dental implant having a side perforation
Image-forming apparatus with improved positioning for medium conveyance
Fluidized bed coal combustion reactor
Esters of retinoic acid and pentaerythritol and monobenzal acetals thereof
Inferencing data types of message components
Method and apparatus for extinguishing fires
Polyimide modified epoxy resins in aqueous emulsions for lamination and electrodeposition