Resources Contact Us Home
Semiconductor memory device having mount test circuits and mount test method thereof

Image Number 4 for United States Patent #8108741.

A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory device including a plurality of memory blocks may include a comparison unit for comparing test data of at least two memory blocks selected from the plurality of memory blocks, deciding whether or not the test data of the selected memory blocks are identical, and outputting a pass signal or fail signal as a flag signal; and an output selection unit for selecting any one of the selected memory blocks as an output memory block, and changing the output memory block whenever the fail signal is generated from the comparison unit, thus forming it as a data output path, which may lessen error occurrence.

  Recently Added Patents
Monitoring heap in real-time by a mobile agent to assess performance of virtual machine
Detecting patterns of abuse in a virtual environment
Scalable packet processing systems and methods
Support for a parameterized query/view in complex event processing
Social community generated answer system with collaboration constraints
Artifact removal in nuclear images
Charged particle source with integrated electrostatic energy filter
  Randomly Featured Patents
Membrane module for hyperfiltration or ultrafiltration of containating liquid flows
Mixing container system
Program and verify method of nonvolatile memory device
Method for manufacturing a semiconductor device
Cable connector with anti cross talk device
Four wheel vehicle
Structure for mounting cameras on a vehicle
Zipper pull extender
Low emissions wood burning stove
Bow press