Resources Contact Us Home
Semiconductor memory device having mount test circuits and mount test method thereof

Image Number 4 for United States Patent #8108741.

A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory device including a plurality of memory blocks may include a comparison unit for comparing test data of at least two memory blocks selected from the plurality of memory blocks, deciding whether or not the test data of the selected memory blocks are identical, and outputting a pass signal or fail signal as a flag signal; and an output selection unit for selecting any one of the selected memory blocks as an output memory block, and changing the output memory block whenever the fail signal is generated from the comparison unit, thus forming it as a data output path, which may lessen error occurrence.

  Recently Added Patents
Pre-primed roofing membrane
Control system for an internal combustion engine
Method and apparatus for supporting management actions for very high throughput in wireless communications
Method of measuring specific absorption rate of electromagnetic waves
System for targeted delivery of therapeutic agents
Method of predicting a motion vector for a current block in a current picture
System and method for providing program recommendations through multimedia searching based on established viewer preferences
  Randomly Featured Patents
Microwave-absorbing materials containing polar icosahedral molecular units and methods of making the same
Stationary thread-cutting device for a sewing machine
Instant film pack
Separation process
Fuel pump
Memory array having dummy cells implemented using standard array cells
Golf club alignment system
Intelligent joining system for a relational database
Retractable writing implement
Ophthalmic measuring apparatus for determining the shape of the cornea of an eye