Resources Contact Us Home
Semiconductor memory device having mount test circuits and mount test method thereof

Image Number 4 for United States Patent #8108741.

A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory device including a plurality of memory blocks may include a comparison unit for comparing test data of at least two memory blocks selected from the plurality of memory blocks, deciding whether or not the test data of the selected memory blocks are identical, and outputting a pass signal or fail signal as a flag signal; and an output selection unit for selecting any one of the selected memory blocks as an output memory block, and changing the output memory block whenever the fail signal is generated from the comparison unit, thus forming it as a data output path, which may lessen error occurrence.

  Recently Added Patents
Control device of hybrid vehicle
Three-term predictive adder and/or subtracter
System for and method of providing single sign-on (SSO) capability in an application publishing environment
Systems and methods for adaptive error thresholds or adaptive modulation schemes based on atmospheric conditions
Method and apparatus for communication channel error rate estimation
Burner grate
Ice data collection system
  Randomly Featured Patents
Timing device for skiers
Apparatus for partially slitting absorbent boards
Focusing a laser beam
Power-open motor-vehicle latch
Conductivity modulated MOSFET
Modular gas units
Communication command control system between CPUs
Plastic-sealed IC device of heat-resistant construction
Sheet counting machine
Hybrid drive for a transportation means