Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor memory device having mount test circuits and mount test method thereof










Image Number 4 for United States Patent #8108741.

A semiconductor memory device having a mount test circuit and a mount test method thereof are provided. The test circuit for use in a semiconductor memory device including a plurality of memory blocks may include a comparison unit for comparing test data of at least two memory blocks selected from the plurality of memory blocks, deciding whether or not the test data of the selected memory blocks are identical, and outputting a pass signal or fail signal as a flag signal; and an output selection unit for selecting any one of the selected memory blocks as an output memory block, and changing the output memory block whenever the fail signal is generated from the comparison unit, thus forming it as a data output path, which may lessen error occurrence.








 
 
  Recently Added Patents
Developing cartridge
Methods of forming activated carbons
Voltage generating system and memory device using the same
Base station apparatus and method for use in mobile communication system
Method and apparatus for map transmission in wireless communication system
Transferring storage devices within storage device testing systems
Method for transforming a single reactor line
  Randomly Featured Patents
Folding wheelchair
Tri (lower alkoxy) benzene derivatives
Oblique clamp
Scheme for information dispersal and reconstruction
Telephone card reader console
Flotation method for orienting chips in the manufacture of surface covering
Organic glass for optical parts
Wavelength division multiplexing optical transmission system and optical transmitting device used in the transmission system
Apparatus and method for measuring physical characteristics of a liquid
Data transfer circuit for use with a base unit or a handset of a telephone system