Resources Contact Us Home
Fault inspection method

Image Number 14 for United States Patent #8103087.

A fault inspection method and apparatus in which the scattergram is separated or objects of comparison are combined in such a manner as to reduce the difference between an inspection object image and a reference image. As a result, the difference between images caused by the thickness difference in the wafer can be tolerated and the false information generation prevented without adversely affecting the sensitivity.

  Recently Added Patents
Portable electric circular saw
Arcuate motion control in electrostatic actuators
Phosphor, light emitting apparatus, and liquid crystal display apparatus using the same
Information processing device and display control method
Automatic pill dispenser
Method for controlling a motor
Television with a stand
  Randomly Featured Patents
Clutch lockout latch
Crash pad for automotive interior and apparatus for manufacturing the same
Endless power transmission belt construction and method of making the same
Maize variety hybrid X8F936
Collapsible frame support for flexible material
Silicon nitride powder, silicon nitride sintered body, sintered silicon nitride substrate, and circuit board and thermoelectric module comprising such sintered silicon nitride substrate
Liquid ejection apparatus and method of controlling the same
Pedestrian trailer
Controlled release compositions
Intravenous admixture protective device