Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Fault inspection method










Image Number 14 for United States Patent #8103087.

A fault inspection method and apparatus in which the scattergram is separated or objects of comparison are combined in such a manner as to reduce the difference between an inspection object image and a reference image. As a result, the difference between images caused by the thickness difference in the wafer can be tolerated and the false information generation prevented without adversely affecting the sensitivity.








 
 
  Recently Added Patents
Key management using quasi out of band authentication architecture
Washing machine
Optimized delivery of web application code
Image sensor with improved color crosstalk
Methods, systems and apparatus for displaying the multimedia information from wireless communication networks
Display control device, display control method, and touchpad input system
Apparatus for touch screen avionic device
  Randomly Featured Patents
Ultra-wide band meanderline fed monopole antenna
Child-resistant closure with castellations
Pneumatic springs and other telescopic systems
Chip carrier socket
Molded article production method and molded article
Spoon
Aluminum interconnects with metal silicide diffusion barriers
Mounting assembly for heater thermostat control
Method for transmission of alarm signals utilizing an entrance telephone system
Highway delineation unit and method of installing same