Resources Contact Us Home
Fault inspection method

Image Number 14 for United States Patent #8103087.

A fault inspection method and apparatus in which the scattergram is separated or objects of comparison are combined in such a manner as to reduce the difference between an inspection object image and a reference image. As a result, the difference between images caused by the thickness difference in the wafer can be tolerated and the false information generation prevented without adversely affecting the sensitivity.

  Recently Added Patents
Metal-containing compositions and method of making same
Fuel cell support structure
Vectorization of program code
Pattern forming method using developer containing organic solvent and rinsing solution for use in the pattern forming method
Fluorescent proteins
Network based technique for obtaining operator identifier for mobile devices
Systems and methods for universal enhanced log-in, identity document verification and dedicated survey participation
  Randomly Featured Patents
Pyridylphenyl compounds for inflammation and immune-related uses
Methods of messaging control of dynamic frequency selection (DFS) for cognitive radio based dynamic spectrum access network systems
Apparatus for uniformly dispensing and distributing material
Server device for net game, net game management method, net game management program, and recording medium which stores net game management program
Method and device for the continuous production of organic mono or polyisocyanates
Optical probe for measuring light transmission of liquid
Sheet-speed reduction mechanism for fan wheel
Toner cartridge
Node scheduling and address assignment within an ad-hoc communication system
Process for detoxification