Resources Contact Us Home
Fault inspection method

Image Number 14 for United States Patent #8103087.

A fault inspection method and apparatus in which the scattergram is separated or objects of comparison are combined in such a manner as to reduce the difference between an inspection object image and a reference image. As a result, the difference between images caused by the thickness difference in the wafer can be tolerated and the false information generation prevented without adversely affecting the sensitivity.

  Recently Added Patents
Systems for usage based rate limiting over a shared data link
Imaging lens having five lens elements, and electronic apparatus having the same
Hair motion compositor system for use in a hair/fur pipeline
Wire catalyst for hydrogenation/dehydrogenation reaction and manufacturing method therefor
Electronic communication device
Anti-FGFR3 antibodies and methods using same
  Randomly Featured Patents
Self-stiffened welded wire lath assembly
Ignition timing control for internal combustion engine
Day and time chronometer movement
Switching circuit utilizing a high voltage transistor protection technique for integrated circuit devices incorporating dual supply voltage sources
Inbred corn line LH185Bt810
Quick connect tube couplings
Wind energy system having an insect sensor
Production and characteristics of anti-teicoplanin polyclonal antibody
Heat sink for a planar waveguide substrate
Antenna assemblies with antenna elements and reflectors