Resources Contact Us Home
Optical inspection system and method

Image Number 14 for United States Patent #8102521.

An inspection system includes optics, an object support for mounting an object in a region of an object plane of the optics, a bright-field light source, and a dark-field light source. The inspection system also includes an image detector having a radiation sensitive substrate disposed in a region of an image plane of the optics and a beam dump.

  Recently Added Patents
Compositions of quaternary ammonium compounds containing bioavailability enhancers
Methods and apparatus for deactivating internal constraint curves when inflating an N-sided patch
Efficient implementation of hash algorithm on a processor
Method and apparatus for performing real time anomaly detection
FET device having ultra-low on-resistance and low gate charge
Authorization method for location based services
  Randomly Featured Patents
Process for fast droping of semiconductors
Substituted indolin-2-one derivatives and their use as P38 mitogen-activated kinase inhibitors
Method for descaling hot rolled strip
Bootstrapping devices using automatic configuration services
Data distribution system
Purification of solutions
Anodically protected heat exchanger
Ladder hinge and multi-position locking mechanism therefor
End connector for flexible printed circuits
Apparatus for positioning a floating hanger