Resources Contact Us Home
Optical inspection system and method

Image Number 14 for United States Patent #8102521.

An inspection system includes optics, an object support for mounting an object in a region of an object plane of the optics, a bright-field light source, and a dark-field light source. The inspection system also includes an image detector having a radiation sensitive substrate disposed in a region of an image plane of the optics and a beam dump.

  Recently Added Patents
Vibration-type driving device
Method for providing side shields for a magnetic recording transducer
Method of controlling braking in a vehicle
Method and apparatus for idling a network connection
Method for producing an L-amino acid using a bacterium of the Enterobacteriaceae family
User equipment terminal, base station and control information transmission method
Scanning method for scanning a sample with a probe
  Randomly Featured Patents
Resistor compositions
Scalable high performance antifuse structure and process
Optical disk apparatus having guide shaft adjusting mechanism
Copper foil excellent in laser beam drilling performance and production method therefor
Apparatus for the surveillance of an electronic security element in an interrogation zone
Process for upgrading andalusite
Method for assembling large space structures
Silicon-based sensors
Detection of road conditions using a beam from an external system i.e. GPS, DBS
Pipe end shape correcting apparatus for UOE metal pipe