Resources Contact Us Home
Optical inspection system and method

Image Number 14 for United States Patent #8102521.

An inspection system includes optics, an object support for mounting an object in a region of an object plane of the optics, a bright-field light source, and a dark-field light source. The inspection system also includes an image detector having a radiation sensitive substrate disposed in a region of an image plane of the optics and a beam dump.

  Recently Added Patents
Non-intrusive processor tracing
Metal foil laminate, substrate for mounting LED, and light source device
Methods and compositions for improving photodynamic therapy through administration of lipids
Method for configuring analog-to-digital converter keys and non-transitory machine readable medium storing program code executed for performing such method
Method for the synthesis of an array of metal nanowire capable of supporting localized plasmon resonances and photonic device comprising said array
Mobile device mode control based on dual mapping of availability (presence) information
  Randomly Featured Patents
Container for waste expelled from a blood gas analyzer or the like
Gift box with a pocket
Fluid pressure proportioning valve and plug member therefor
Encapsulation method for localized oxidation of silicon with trench isolation
Downhole fracture analysis
ATM switching equipment and data editing system
Virtualization of pin functionality in a point-to-point interface
Composite gem stone and production method
Magnetic bearing systems
Paint compositions