Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Time-of-flight mass spectrometry of surfaces










Image Number 3 for United States Patent #8101909.

The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.








 
 
  Recently Added Patents
Photovoltaic device and manufacturing method thereof
Visual alert system for set-top box standby mode
Extensible file and path renaming during multimedia acquisition
Light emitting diode array
In--Ga--Zn type oxide sputtering target
Vehicle for towing an airplane
Bootstrap of NFC application using GBA
  Randomly Featured Patents
Seating member for connecting a continuous-flow earmold tubing connector to an earmold
Sterilization method
Remote control
Dough divider
Handle for barbecue grill tools
Reference thickness endpoint techniques for polishing operations
Softgel of NLKJ for treating prostate diseases
Brake valve especially for motor vehicles
One-piece roof vent device and methods of constructing and utilizing same
Holder for tablet personal computer