Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Time-of-flight mass spectrometry of surfaces










Image Number 3 for United States Patent #8101909.

The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.








 
 
  Recently Added Patents
(4930
Electrode tab for secondary battery and secondary battery using the same
Parasitic element compensation circuit and method for compensating for the parasitic element
Automatically capturing images that include lightning
Image correction method
Method and system for modularized configurable connector system for ethernet applications
Liquid crystal panel and liquid crystal display
  Randomly Featured Patents
Segmented bar display for a programmable tuner
Organic light emitting device
Hyperactive light signal related molecule of HFR1-.DELTA.N105 and transgenic plant thereof
X-ray moire microscope
Dispersible, metal oxide-coated, barium titanate materials
Context sensitive pop-up window for a portable phone
Color ribbon for thermo-sublimation print, method for the manufacture of same and its application
Diagnosis system for a motor vehicle
Pool skimmer basket assembly including a buoyant handle
Pick up apparatus