Resources Contact Us Home
Time-of-flight mass spectrometry of surfaces

Image Number 3 for United States Patent #8101909.

The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.

  Recently Added Patents
Pausing multimedia data streams
Adhering composition and method of applying the same
Cancer vaccines containing epitopes of oncofetal antigen
Artifact removal in nuclear images
Movable assemblies for an image reader unit and a cover unit in an image formation apparatus
Selecting a converter operating mode of a PA envelope power supply
  Randomly Featured Patents
Apparatus for mapping and coagulating soft tissue in or around body orifices
Color filter substrate, manufacturing method thereof, displaying device, electro-optical device and electronic instrument
Pigmented jet printing ink
Ball-like beverage container
Autonomous vehicle automatically running on route and its method
Use of sulfonated 2-(2'-hydroxyaryl)-s-triazines as photostabilizing agents for wool and other protein fibres
Preparation of alcohols by treating esters with alkali metal borohydride
Composite flexible blanket insulation
Method and apparatus for combining gene predictions using bayesian networks
Composition for treatment of cervix cancer