Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Time-of-flight mass spectrometry of surfaces










Image Number 3 for United States Patent #8101909.

The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.








 
 
  Recently Added Patents
Peer-to-peer, internet protocol telephone system with proxy interface for configuration data
Radiation protective garment with forced ventilation and method
Extreme ultraviolet light source device and method for generating extreme ultraviolet light
Mask and method for forming the mask
Method for the treatment, alleviation of symptoms of, relieving, improving and preventing a cognitive disease, disorder or condition
Heat transfer label for decorating a metal container
Semiconductor device and manufacturing method
  Randomly Featured Patents
Four-stroke radial-piston engine
Delay line for a traveling-wave tube cooled by heat pipes and a traveling-wave tube comprising a delay line of this type
Forming a carbon layer between phase change layers of a phase change memory
Utility rack anchor
Word puzzle game
Headset visual feedback system
System and method for protecting memory during system initialization
Determining and describing available resources and capabilities to match jobs to endpoints
Apparatus and method for time maintenance in a satellite position system receiver
Method for coating and infusing nut products with honey-sucrose solution for roasting