Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for evaluating an evaluated pattern of a mask










Image Number 5 for United States Patent #8098926.

A method, system and a computer program product for evaluating an evaluated pattern of a mask, the method includes: receiving multiple moments that represent an image of the evaluated pattern; wherein a size of information required for representing the multiple moments is substantially smaller than a size of pixel information that form the image of the evaluated pattern; and processing the multiple moments in order to determine at least one shape parameter of the evaluated pattern.








 
 
  Recently Added Patents
Wireless communication power control
Method of forming solderable side-surface terminals of quad no-lead frame (QFN) integrated circuit packages
Double patterning method using tilt-angle deposition
PEGylated, extended insulins
Cooler
Error protection for pipeline resources
Defect detection system and method
  Randomly Featured Patents
Inhibitors of the 26s proteolytic complex and the 20s proteasome contained therein
Benzofuran derivative
Methods and apparatus for resolving wireless signal components
Translucent personal cleansing bars
Flyback DC-DC converter with feedback control
Process for making silicon nitride cutting tool material
Electric discharge machining power supply circuit
Tool for a cleaning appliance
System and method for overwriteable magneto-optical recording
Mono-, di- and polyol phosphate esters in personal care formulations