Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor IC incorporating a co-debugging function and test system










Image Number 5 for United States Patent #8055946.

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.








 
 
  Recently Added Patents
Color imaging device
Account and customer creation in an on-line banking model
Mobile advertising and compensation-verification system
Display device and projector
Method and system for encrypting data in a wireless communication system
Providing a multi-tenant knowledge network
Cosmetic product including vegetable oil blend
  Randomly Featured Patents
Lamp with retaining ring
Synthesis of radiofluorinated peptide using microwave activation technology
Camera having lens mount
Methods of using a telescoping guide catheter with peel-away outer sheath
Playing court
Portable hygienic water jet having sanitary disposable nozzle protector on non-disposable nozzle
Principal traffic light focal group with capsule-type variable double time and message indicator
Memory cell array in a semiconductor memory device with select lines formed in a U-like shape
Automobile fuel control system
Method for spatial synchronization of a digitally coded video image and/or for identification of the syntax of a video sequence