Resources Contact Us Home
Semiconductor IC incorporating a co-debugging function and test system

Image Number 5 for United States Patent #8055946.

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

  Recently Added Patents
Housing for gas flow indicator
Rear bumper for an automobile
Creating three dimensional graphics data
Haworthia plant named `CAPETOWN`
Shoe bag
Multicyclic compounds and methods of use thereof
Positioning vehicles to improve quality of observations at intersections
  Randomly Featured Patents
Steering wheel construction
Instrument for induction of labor
Preparations for covering undamaged and/or damaged areas of human or animal skin
Disposable absorbent hygiene article having waistband pockets improving the sealing
Animal feed management system
Apparatus for providing continuous integration of an input signal while allowing readout and reset functions
Cap for cosmetic product
Method of making an integrated circuit with capacitor
Semiconductor device of high breakdown voltage
Identification data insertion and detection system for digital data