Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Semiconductor IC incorporating a co-debugging function and test system Image Number 5 for United States Patent #8055946. A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.       Recently Added Patents Computer system for routing package deliveries Maize variety hybrid X13A495 Tuning peg for a stringed instrument Charging current control method and charging system Feature management of a communication device Mirac proteins Authenticating messages sent between a vehicle and a central facility   Randomly Featured Patents DMOS transistor structure with gate electrode trench for high density integration and method of fabricating the structure Motor vehicle security system Method of manufacturing an electronic device, and electronic device Combined pad holder and tape dispenser Method of manufacturing a bonded particulate article by reacting a hydrolyzed amylaceous product and a heterocyclic compound Intent fulfillment Line head and an image forming apparatus using the line head Hollow glass fiber bushing, method of making hollow fibers and the hollow glass fibers made by that method Method for the production of a multi-directional fibrous structure and device for carrying out said method Provision of public service identities © 2006-2008 PatentGenius. All Rights Reserved.