Resources Contact Us Home
Semiconductor IC incorporating a co-debugging function and test system

Image Number 5 for United States Patent #8055946.

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

  Recently Added Patents
Unified model design for pending and production information and versioned information
System and method for depositing a material on a substrate
Groupware-integrated business document management
Compressed air dissector (air jet scraper)
Output image data generating device and method of generating output image data
Method and apparatus providing privacy setting and monitoring user interface
Composite material
  Randomly Featured Patents
Trim component having energy absorbing feature
Server and method for managing DNSSEC requests
Analog FIR-filter with .SIGMA. .DELTA. modulator and delay line
Thermal-insulating material having an essentially magnetoplumbitic crystal structure
Wide input common mode sense amplifier
Head gimbal assembly and magnetic disk drive with specific solder ball or slider pad and electrode stud dimensioning to produce reliable solder ball connection using laser energy
Built-in tip for a bag and method of making same
Steering wheel with an air bag unit and method of manufacture
Antiviral arylenedioxyalkyl substituted pyrazoles
Hose-in-hose coupler with longitudinally shiftable sleeve