Resources Contact Us Home
Semiconductor IC incorporating a co-debugging function and test system

Image Number 5 for United States Patent #8055946.

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

  Recently Added Patents
System and method for ranking content and applications through human assistance
Semiconductor device
System and method for detecting executable machine instructions in a data stream
Pharmaceutical composition for treating CAPRIN-1 expressing cancer
Maize variety hybrid X13A495
Bacterial superantigen vaccines
System and method for deposition in high aspect ratio magnetic writer heads
  Randomly Featured Patents
Method and apparatus for predicting future behavior of data streams
Holder for a flexible circuit board
Pill or capsule card filling apparatus and method
Radiator grille for vehicle
Video tape reproducing apparatus with a processor that time-shares different operations
Animal or other object washing system and method
Managing XPath expressions in a database system
Sequential mono-lobe tracker
Call processing method and apparatus in a private communication system
Energization control apparatus