Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Semiconductor IC incorporating a co-debugging function and test system Image Number 5 for United States Patent #8055946. A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.       Recently Added Patents Amide derivatives, process for preparation thereof and use thereof as insecticide Video-recording reservation management apparatus, method, program, and system Method and system for network configuration for virtual machines Data unit receiver and sender control method Semiconductor memory device System for implementing dynamic pseudorandom keyboard remapping Wireless communication system, associated methods and data structures   Randomly Featured Patents Conveyor belt support Compressed-air pile-driver High density DRAM with reduced peripheral device area and method of manufacture Panel unit swing mechanism having first and second guide grooves and first and second connecting members N-phenyl-4-(4-pyridyl)-2-pyrimidineamine derivatives Swash plate anti-torque mechanism Retainer for a carpet runner Magnetic recording medium Charge/discharge control apparatus Compound centrifuge tube © 2006-2008 PatentGenius. All Rights Reserved.