Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Semiconductor IC incorporating a co-debugging function and test system Image Number 5 for United States Patent #8055946. A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.       Recently Added Patents Unified model design for pending and production information and versioned information System and method for depositing a material on a substrate Groupware-integrated business document management Compressed air dissector (air jet scraper) Output image data generating device and method of generating output image data Method and apparatus providing privacy setting and monitoring user interface Composite material   Randomly Featured Patents Trim component having energy absorbing feature Server and method for managing DNSSEC requests Analog FIR-filter with .SIGMA. .DELTA. modulator and delay line Thermal-insulating material having an essentially magnetoplumbitic crystal structure Wide input common mode sense amplifier Head gimbal assembly and magnetic disk drive with specific solder ball or slider pad and electrode stud dimensioning to produce reliable solder ball connection using laser energy Built-in tip for a bag and method of making same Steering wheel with an air bag unit and method of manufacture Antiviral arylenedioxyalkyl substituted pyrazoles Hose-in-hose coupler with longitudinally shiftable sleeve © 2006-2008 PatentGenius. All Rights Reserved.