Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor IC incorporating a co-debugging function and test system










Image Number 5 for United States Patent #8055946.

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.








 
 
  Recently Added Patents
Method and system for triggering message waiting indicator delivery
Information processing apparatus, information processing method, and program
Methods and systems for delivering customized advertisements
Implantable defibrillator systems and methods with mitigations for saturation avoidance and accommodation
Soft co-processors to provide a software service function off-load architecture in a multi-core processing environment
Voltage detection apparatus and combination circuit
Image display device and method of changing first EDID with second EDID wherein the second EDID information is compatible with image display device
  Randomly Featured Patents
Optical scanning apparatus configured to deflect and scan laser beam by using MEMS mirror
Method and apparatus for structural conversion of poultry houses
Two head dry shaver
Treatment of arthritis and other similar conditions
Vehicle performance evaluation test method and apparatus
Cut for a box for cigarettes and cigarillos and box made therefrom
Differential mobility spectrometer with spatial ion detector and methods related thereto
Method and apparatus for implementing Q-trees
Post anchor system
Antisense modulation of PTPN2 expression