Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Methods and systems for determining a position of inspection data in design data space










Image Number 13 for United States Patent #8041103.

Various methods and systems for determining a position of inspection data in design data space are provided. One computer-implemented method includes determining a centroid of an alignment target formed on a wafer using an image of the alignment target acquired by imaging the wafer. The method also includes aligning the centroid to a centroid of a geometrical shape describing the alignment target. In addition, the method includes assigning a design data space position of the centroid of the alignment target as a position of the centroid of the geometrical shape in the design data space. The method further includes determining a position of inspection data acquired for the wafer in the design data space based on the design data space position of the centroid of the alignment target.








 
 
  Recently Added Patents
Composable SQL query generation
Paint producing method and paint producing system
Authentication and synchronous interaction between a secondary device and a multi-perspective audiovisual data stream broadcast on a primary device geospatially proximate to the secondary devi
Multi-level supply chain management system and methods
Method for progressively determining depth from defocused images
Rear bumper for automobile
Phase-locked loop having a constant damping ratio
  Randomly Featured Patents
Fuel pipe joint on an aircraft
Set of tips for fingernails and toenails
Suspension subframe assembly
Dynamoelectric machine
Portable hockey practice system
Ultrasound-imaging diagnostic system
Injection molding machine having a mixer insert
Malfunction alerting indicator for carburetor choke valve
Monocotyledon plant cells and plants which synthesize modified starch
Delivery device with a protective sleeve