Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Rate limited active pilot inceptor system and method










Image Number 5 for United States Patent #8002220.

A variable rate limit is implemented in an active inceptor haptic feedback control system. The rate limit is modulated based on a rate error between an aircraft rate command supplied from the active inceptor, and actual aircraft rate. As the rate error increases, the rate limit is reduced, which limits inceptor movement and provides haptic feedback to a user when the rate error is exceeded.








 
 
  Recently Added Patents
System and method for reducing the risks involved in trading multiple spread trading strategies
Organic light emitting display apparatus
Method and device for accessing the documentation of an aircraft according to alarms generated therein
Synchronization scheduling apparatus and method in real-time multi-core system
Rotating-body electrification mechanism, image carrier unit, process cartridge, image forming apparatus, and method for electrifying image carrier unit
System and method for passing PLC signals from a first electrical line to a second electrical line
Method for configuring analog-to-digital converter keys and non-transitory machine readable medium storing program code executed for performing such method
  Randomly Featured Patents
Combined dictating microphone and tracking ball for cursor control
Connection information management system for managing connection information used in communications between IC cards
Light guide member, illumination apparatus, and image capturing apparatus using the same
Information recording carrier and method of reproducing the same
Structure and method for hard mask removal on an SOI substrate without using CMP process
Method, medium and apparatus rendering 3D graphic data using point interpolation
Electric-signal amplifying device using light transmission
Method and system for assembling complex objects
Arrangement for protection of metal surfaces against corrosion
Semiconductor device structures including damascene trenches with conductive structures and related method