Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Secondary index and indexed view maintenance for updates to complex types










Image Number 4 for United States Patent #7933913.

Pursuant to receipt of a data modification command or statement, such as an Update command, it is determined which fields in a data structure, such as a UDT, computed column, indexed view, or index, for example, will be changed as a result of the command. Only those fields that are affected by the command will be changed. Thus, changes are propagated to only to those dependent data structures whose content is being modified. Tree representations are used to facilitate the determination as to whether a subfield in a hierarchy is changed.








 
 
  Recently Added Patents
Method and system for the geolocation of a radio beacon in a search and rescue system
Synergistic fungicidal interactions of 5-fluorocytosine and other fungicides
Systems and methods for tracking mobile terrestrial terminals for satellite communications
Tint block image generation program and tint block image generation device
System, apparatus and method for enabling/disabling display data channel access to enable/disable high-bandwidth digital content protection
Precoding codebooks for MIMO communication systems
Optical modulator module
  Randomly Featured Patents
Trifluoro- quinoline -3- carboxylic acids and their use as anti-bacterial agents
Light-absorbing member
Inductance element, method for manufacturing the inductance element, and switching power supply using the inductance element
Driver for a power converter and a method of driving a switch thereof
Counterbalance safety guard for a dual action sander
Method and apparatus for improving putting skill
Cable for conducting energy
Method and apparatus for using steam in a commercial laundry machine as an environmentally-friendly replacement of conventional dry cleaning or wet cleaning processes
Semiconductor processing method of forming field isolation oxide using a polybuffered mask which includes a base nitride layer on the substrate, and other semiconductor processing methods
Method for evaluating the efficacy of an antifungal agent