Resources Contact Us Home
Determining a location or position using information from multiple location and positioning technologies and applications using such a determined location or position

Image Number 6 for United States Patent #7904244.

A location may be determined by accepting location information from at least two sources using at least two location technologies, for each set of location information from each source, adjusting the location information using at least one of (A) confidence in the source, (B) error range of the source, (C) an error model for the source, and (D) application-specific context information, and combining adjusted locations to generate a final location these location technologies assume a degree of cooperation. The location technologies may include a combination of a "tag" that is placed on the object to be tracked, and one or more receivers/transmitters that work in concert with the tag to locate the object.

  Recently Added Patents
Power storage device and method for manufacturing the same
Solid-state image pickup element, method of manufacturing the same, and image pickup apparatus including the same
Image display device and capsule endoscope system
Traffic flow analysis mitigation using a cover signal
High performance adaptive switched LED driver
Circuit and method for generating an AC voltage from a plurality of voltage sources having a temporally variable DC output voltage
  Randomly Featured Patents
Sensor component
Method and apparatus for disposing of used syringe needles
Window component extrusion
Transverse fan assembly having a supplementary air feed inlet for infill of air flow deficiencies to effect a desired output air flow pattern, and method of use thereof
Pacer lettuce variety
Method for producing polymers containing carbamate units and the use thereof
Cold weather eyeglass system with protective shield
Semiconductor memory device with an improved hierarchical power supply line configuration
Electrocardiograph leadwire assembly
Quasi-optical coupler with reduced diffraction