Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Analog reference voltage generator, method thereof, analog-to-digital converter including the same, and image sensor including the same










Image Number 2 for United States Patent #7755531.

An analog reference voltage generator for generating a monotonously increasing or decreasing analog reference voltage includes a plurality of dump cells in front of an operational amplifier and controls the dump cells using a plurality of clock signals, respectively, which do not overlap each other in time, thereby increasing a ramping speed. The analog reference voltage generator including the plurality of dump cells controls the generation of an analog reference voltage using the plurality of clock signals obtained by dividing a master clock signal, thereby preventing the voltage level of the reference signal from decreasing due to an increase of the load.








 
 
  Recently Added Patents
Method and system of a sensor interface having dynamic automatic gain control
Soybean cultivar BY0811143
Electrode tab for secondary battery and secondary battery using the same
Frame syncrhonization in orthogonal frequency-division multiplexing systems
Silicas and alkali metal salt compositions, detergents formed from such compositions and method of forming such compositions and detergents
Patterned birefringent product
Housing for gas flow indicator
  Randomly Featured Patents
Circuit for enhancing chrominance transitions in real-time video reception
Selective data broadcasting receiver adapter apparatus and method for personal computers
Programmed gelation of polymers using melamine resins
Wideband self mixing millimeter wave receiver
Starting system for diaphragm carburetor
Hydrocarbon conversion with dual metal promoted zeolite
MRAM device and integration techniques compatible with logic integration
Use of carvedilol for treatment of diabetes mellitus
Coated shaker screen apparatus and method
Method and apparatus for selectively providing data from a test head to a processor