Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Image sensor and method of manufacturing the same










Image Number 2 for United States Patent #7649219.

An image sensor and a method of manufacturing the same are provided. The image sensor includes a semiconductor substrate, a metal line layer, a first conduction type conducting layer, a first pixel isolation layer, an intrinsic layer, and second conduction type conducting layer. The semiconductor substrate includes a circuit region. The metal line layer including a plurality of metal lines and an interlayer insulating layer is formed on the semiconductor substrate. The first conductive layer having patterns separated from each other by the pixel isolation layer is formed on the metal lines. The first pixel isolation layer is formed between the separated patterns of the first conduction type conducting layer. The intrinsic layer is formed on the first conductive layer and the first pixel isolation layer. The second conduction type conducting layer is formed on the intrinsic layer.








 
 
  Recently Added Patents
Lead with lead stiffener for implantable electrical stimulation systems and methods of making and using
Synthesized interoperable communications
Arrangements and method relating to communication bearers
Cationic polymers for antimicrobial applications and delivery of bioactive materials
Method for cutting C--Mn steel with a fiber laser
Method of controlling an indentation depth of an electrode into a metal substrate during welding
Method, device, and system for configuring component carrier in carrier aggregation scenario
  Randomly Featured Patents
Computer controlled automatic shift drill
Loader
Auxiliary wheel assembly
Storage interface unit
Ink set and media for ink-jet printing
Electronic dictionary and language interpreter with multiple inflection display
Sheet inserter and methods of inserting sheets into a continuous stream of sheets
Negative heel protector cushion
Boot scrubber
Method and apparatus for measuring the parallelism of two surfaces