Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Semiconductor device having a mode of functional test










Image Number 3 for United States Patent #7484135.

A semiconductor device includes a circuit block; a first signal path for guiding a test signal to a signal input terminal of the circuit block; a second signal path for guiding a test clock to a clock input terminal of the circuit block; a third signal path for guiding a test output signal from a output terminal of the circuit block to a pad via a dummy latch; and a fourth signal path for guiding the test output signal from the output terminal of the circuit block, to another pad. A dummy latch latches the test output signal at substantially a same speed as an operational latch during a normal operation. The third signal path has a wiring delay time from the output terminal to the dummy latch that is substantially equal to a wiring delay time from the output terminal to the operational latch.








 
 
  Recently Added Patents
Tracking data eye operating margin for steady state adaptation
Techniques for distributed storage aggregation
Database caching utilizing asynchronous log-based replication
Rechargeable battery
Document layout method
Biomarker for Barrett's Oesophagus
Silicon-on-insulator (SOI) structure configured for reduced harmonics and method of forming the structure
  Randomly Featured Patents
Image display device and drive device therefor
Current source circuit and design methodology
Projection lens and projection-type display apparatus using the lens
Heavy-transport radial tire with belt cushion gum strip between tread belt and shoulder cushion
Inbred corn line 3JP286
Jump starter
Electrostatic discharge protection circuit triggered by MOS transistor
Balloon anchored cannula
Liquid cell
Voice enhancer system