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Method and an apparatus for measuring the input threshold level of device under test

Image Number 3 for United States Patent #7482817.

A signal including at least one group of a group comprised of two slopes having different gradients and a known temporal position relationship is applied to a device under test, the time intervals between the specific transitions of the logic level produced in the output signal of the device under test in response to the slopes included in the applied signal are measured, and the measurements are used to obtain the input threshold level of the device under test.

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