|
 Image Number 12 for United States Patent #7430282.
A heel effect compensation filter is configured to have a thickness distribution that uniforms an X-ray intensity angular distribution that is nonuniform in the body axis direction of a subject in an X-ray flux irradiated space. The space is formed by an X-ray flux diverging from an anode in a body width direction of the subject and diverging in a shape of an approximate sector in the body axis direction due to the heel effect, when the X-ray flux generated on the anode by irradiating a thermoelectron beam flux from a cathode to the anode is irradiated on the subject. The thickness distribution can be obtained using a predetermined formula.
|
|
|