Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and apparatus for chemometric estimations of fluid density, viscosity, dielectric constant, and resistivity from mechanical resonator data










Image Number 19 for United States Patent #7317989.

The present invention provides a chemometric equation to estimate fluid density, viscosity, dielectric constant and resistivity for a formation fluid sample downhole. The chemometric estimates can be used directly as estimated values for fluid density, viscosity, dielectric constant and resistivity for a formation fluid sample downhole. The chemometric estimates can also be plugged into a Levenberg-Marquardt (LM) non-linear least squares fit, as an initial estimate of the parameter to be estimated by the LM fit. If the initial parameter estimate is too far from the actual parameter values, the LM algorithm may take a long time to converge or even fail to converge entirely. The present invention estimates an initial value of a parameter that provides a high probability that the LM algorithm will converge to a global minimum.








 
 
  Recently Added Patents
Display screen with transitional icon
Methods of establishing virtual circuits and of providing a virtual private network service through a shared network, and provider edge device for such network
Partial response decision feedback equalizer with distributed control
Barrier layers comprising Ni-inclusive ternary alloys, coated articles including barrier layers, and methods of making the same
Media processing method and device
Etch resistant clearcoat
Nitride semiconductor laser device
  Randomly Featured Patents
Packaging container
Process and apparatus for absorption of zinc vapour in molten lead
Method for introducing a fluid into a reaction receptacle contained within a temperature-controlled environment
Cartridge
Sensor for testing light and weather resistance of samples
Inkjet recording apparatus
Clad material with unheated welding adhesion
Method for forming field oxide isolation film
Column selecting circuit in semiconductor memory device
Abrasive wear tester