Resources Contact Us Home
System and method for measuring wave directional spectrum and wave height

Image Number 12 for United States Patent #7317660.

A system and method for measuring the directional spectrum of one or more waves in a fluid medium using a multi-beam sonar system is disclosed. In an exemplary embodiment, range cells located within a plurality of acoustic beams are sampled to provide current velocity data. Optionally, wave surface height and pressure data is obtained as well. A sensitivity vector specifically related to the ADCP's transducer array geometry is used in conjunction with maximum likelihood method (MLM), iterative maximum likelihood method (IMLM), or other similar methods to solve a the wave equation at each frequency and produce a frequency-specific wave directional spectrum. The frequency-specific spectra are combined to construct a complete two-dimensional wave directional spectrum.

  Recently Added Patents
Elementary network description for efficient link between neuronal models and neuromorphic systems
Devices, systems, and methods for tactile feedback and input
Lettuce sister lines PX06514083, PX06514153, PX06514201 and PX06514204
Preparation of isomerically pure substituted cyclohexanols
Method of patterning color conversion layer and method of manufacturing organic EL display using the patterning method
Reverse mapping method and apparatus for form filling
Wound dressing with a discontinuous contact layer surface
  Randomly Featured Patents
Tubular biofilm reactor
Food dispensing feeding system
Method and apparatus for self-instruction
Porous high temperature seal abradable member
Image forming apparatus
Wrenches having two driving stems pivotally connected with each other
Compositions and methods for the treatment of renal and cardiovascular disease
Portable computer with memory management system and method for prolonging the lifetime of internal battery
Tote bag
Vehicular active sound control system