Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and method for measuring wave directional spectrum and wave height










Image Number 12 for United States Patent #7317660.

A system and method for measuring the directional spectrum of one or more waves in a fluid medium using a multi-beam sonar system is disclosed. In an exemplary embodiment, range cells located within a plurality of acoustic beams are sampled to provide current velocity data. Optionally, wave surface height and pressure data is obtained as well. A sensitivity vector specifically related to the ADCP's transducer array geometry is used in conjunction with maximum likelihood method (MLM), iterative maximum likelihood method (IMLM), or other similar methods to solve a the wave equation at each frequency and produce a frequency-specific wave directional spectrum. The frequency-specific spectra are combined to construct a complete two-dimensional wave directional spectrum.








 
 
  Recently Added Patents
Materials and methods for stress reduction in semiconductor wafer passivation layers
Solar energy converter with improved photovoltaic efficiency, frequency conversion and thermal management permitting super highly concentrated collection
(4945
Patterned MR device with controlled shape anisotropy
Method of sending CTI messages in a communication system
Pill identification and counterfeit detection method
Portable computer display structures
  Randomly Featured Patents
Vandal-proof cover for a faucet
Chalaropsis lysozyme protein and its method of use in anti-bacterial applications
Method of concentrating a solution of methylene diphenyl diisocyanate in diphenyl oxide
Sanitary handle for shopping carts
Chiral amino alcohols and process for preparation of same
Wastewater treatment system including multiple stages of alternate aerobic-anerobic bioreactors in series
Particle-beam apparatus with improved wien-type filter
Free-size cap
Box
Apparatus for making, filling, closing and boxing bags