Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and methods for classifying anomalies of sample surfaces










Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.








 
 
  Recently Added Patents
Method of operating a split gate flash memory cell with coupling gate
Split-ring resonator creating a photonic metamaterial
Method for evaluating performance characteristics of dental curing lights
Antenna device
Systems and methods for universal enhanced log-in, identity document verification and dedicated survey participation
Receiver with feedback continuous-time delta-sigma modulator with current-mode input
Method and apparatus for wireless transmission of diagnostic information
  Randomly Featured Patents
Key chain
Beverage and method for making a beverage for the nutritional supplementation of calcium in humans
Hsp90 family protein inhibitors
End connector
Derivatives of antibiotic tylosin
Image server store system and method using combined image views
Can trowel
Groove cable
Gas sensor
Toxic material disposal