Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and methods for classifying anomalies of sample surfaces










Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.








 
 
  Recently Added Patents
Nickel-cobalt-manganese multi-element lithium ion battery cathode material with dopants and its methods of preparation
Reference circuit with curvature correction using additional complementary to temperature component
Semiconductor device
Systems, devices, methods, and compositions including fluidized x-ray shielding compositions
Digital media content distribution
5-HT.sub.3 receptor modulators, methods of making, and use thereof
Time sharing type autostereoscopic display apparatus and method for driving the same
  Randomly Featured Patents
Tri-directional interconnect architecture for SRAM
Device for transport of multi-layer, edge-perforated imprint-receiving substrates
Design for testability method selectively employing two methods for forming scan paths in a circuit
Multi-layer capacitive transducer
Hydrogen storage alloy, production method therefor and nickel-hydrogen secondary battery-use cathode
Switching device for electronic timepiece
Optical devices employing beam folding with polarizing splitters
Method for accessing bypassed production zones
Adaptive and progressive protection of fixed images encoded in wavelets
Vibroseis calibration technique and system