Resources Contact Us Home
System and methods for classifying anomalies of sample surfaces

Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.

  Recently Added Patents
Control unit including a computing device and a peripheral module which are interconnected via a serial multiwire bus
Establishing a graphical user interface (`GUI`) theme
Fuel cell and a method of manufacturing a fuel cell
Caprazene as a novel compound and derivatives thereof, and caprazol as a novel compound and derivatives thereof
Pyridylphenyl compounds for inflammation and immune-related uses
Pre and post-paid real time billing convergence system
Method for producing organo-oligo silsesquioxanes
  Randomly Featured Patents
Cover retainer assembly for inflatable restraint air bag
Pulse width modulator motor control
Coated elongated core material
Shift control device for automatic transmission and control method thereof
Ultrasonic instrument using langevin type transducers to create transverse motion
Method and apparatus for selecting call list numbers based on entry/exit to a WLAN
Implement for ground treatment with a dead-man safety
Elimination of modulated light effects in rolling shutter CMOS sensor images
Method and apparatus for measuring the resonant frequency of a high Q resonator
Amine compounds and inhibiting neurotransmitter reuptake