Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and methods for classifying anomalies of sample surfaces










Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.








 
 
  Recently Added Patents
Clostridium chauvoei polypeptide, DNA encoding the polypeptide and a vaccine comprising the polypeptide
Powerline communication device with load characterization functionality
Aware manufacturing of integrated circuits
Dose escalation enzyme replacement therapy for treating acid sphingomyelinase deficiency
Storage basket with lid
Lithographic apparatus and device manufacturing method
Efficient file system metadata scanning using scoped snapshots
  Randomly Featured Patents
Integrated circuit carrier arrangement for reducing non-uniformity in current flow through power pins
Adaptive proximity sensing
Display unit for a measuring instrument
System and scanout circuits with error resilience circuit
Process for printing and molding a flocked article
Process for the electrochemical synthesis of carboxylic acids
Printing device and printing method
Overvoltage protection device and manufacturing process for the same
Use of optically active tetrahydrofuran-2-carboxylic acid esters as dopants in liquid-crystal mixtures, liquid-crystal mixtures containing same and novel optically active tetrahydrofuran-2-car
Housing for a water treatment system control valve