Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and methods for classifying anomalies of sample surfaces










Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.








 
 
  Recently Added Patents
Acoustic measuring instrument
Liquid crystal display and manufacturing method thereof
Guitar strap attachment means
Light powered hearing aid
Vehicle hood
Systems and methods for documenting medical findings of a physical examination
Semiconductor device
  Randomly Featured Patents
Heliotropium plant named `Heliosil`
Method and device for treating cancer with electrical therapy in conjunction with chemotherapeutic agents and radiation therapy
Countercurrent dehydration by hollow fibers
Computer mouse with a sliding cover
Optical detector device
Color video processing circuitry
EL display with electrodes normal to the surface
Disposable cartridge for investigating physical properties of blood
Method for treating abdominal discomfort
Recording liquid, liquid cartridge, liquid discharge device, and liquid discharge method