Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
System and methods for classifying anomalies of sample surfaces










Image Number 10 for United States Patent #7315365.

Two or more defect maps may be provided for the same sample surface at different detection sensitivities and/or processing thresholds. The defect maps may then be compared for better characterization of the anomalies as scratches, area anomalies or point anomalies. This can be done without concealing the more significant and larger size defects amongst numerous small and immaterial defects. One or more defect maps can be used to report the anomalies with classified information; the results from this map(s) can be used to monitor the process conditions to obtain better yield.








 
 
  Recently Added Patents
Sequential control device for a striking mechanism
Method of transmitting and receiving wireless resource information
Image forming apparatus, information processing method, and storage medium for generating screen information
Soft co-processors to provide a software service function off-load architecture in a multi-core processing environment
Method and device for surface scanning of a patient
User interfaces
Interest point detection
  Randomly Featured Patents
Apparatus for the treatment and conveyance of feed sludge
Printer with cantilevered gear-driven platen roll
Multiple radial finger contact cooling device
Impeller of a suction-enforced type and fan-motor having the same
Lubrication system and method of lubricating an internal-combustion engine
Wide angle zoom lens having a high variation ratio
Apparatus for machining a non-circular workpiece
Process for producing zinc dialkyldithiophosphates exhibiting improved seal compatibility properties
Method of manufacturing hard capsules
Sinusoidal radio-frequency clock distribution system for synchronization of a computer system