Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Method and system for e-beam scanning Image Number 16 for United States Patent #7276690. The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.       Recently Added Patents Abrasive waterjet machining and method to manufacture a curved rotor blade retention slot Electronic organ type accelerator pedal Processing strings based on whether the strings are short strings or long strings Partial filling of a pulse detonation combustor in a pulse detonation combustor based hybrid engine Differentiated PSIP table update interval technology Methods for concomitant administration of colchicine and a second active agent Heat integrated distillation apparatus   Randomly Featured Patents N-propyl bromide based cleaning solvent and ionic residue removal process Mail delivery signal with flat signal plates Method and apparatus for determining defectiveness/non-defectiveness of a semiconductor laser by examining an optical output from the semiconductor laser Apparatus for desalting sea water or brackish water Direct-coupled output stage for rapid-signal biological stimulator Engine exhaust gas recirculation control system Method of making a semiconductor device Certain substituted 1-aryl-3-piperazin-1'-yl propanones Boron carbide-aluminum cermets having microstructures tailored by a post-densification heat treatment Transport apparatus © 2006-2008 PatentGenius. All Rights Reserved.