Resources Contact Us Home
Method and system for e-beam scanning

Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.

  Recently Added Patents
Pharmaceutical compositions of paclitaxel, paclitaxel analogs or paclitaxel conjugates and related methods of preparation and use
Tandem electric machine arrangement
Customizing a range of acceptable tape dimensional stability write conditions
System and method for logical separation of a server by using client virtualization
Implantable defibrillator systems and methods with mitigations for saturation avoidance and accommodation
Continuously variable transmission and control method thereof
System and method for content delivery
  Randomly Featured Patents
Upward plug filled via hole device
Solar powered radiometric lift device
Method and apparatus for providing an integrated circuit having p and n doped gates
Corrosion-resistant thread joint for percussion drill element and method of achieving such resistance
Clock processing logic and method for determining clock signal characteristics in reference voltage and temperature varying environments
Electromotive power steering controller
Method of making photocathodes for image intensifier tubes
System for electrosurgical treatment of submucosal tissue
Synthesis of microporous ceramics
Switch circuit and method of switching radio frequency signals