Resources Contact Us Home
Method and system for e-beam scanning

Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.

  Recently Added Patents
Method and system for associating a cell-sector with time-dependent location parameters
Efficient forward ranking in a search engine
Touchscreen with Z-velocity enhancement
Bicycle carrier
Inhibitors of human immunodeficiency virus replication
Flexible organic light emitting device and manufacturing method thereof
Image forming apparatus having exhaust fan
  Randomly Featured Patents
Method for the preparation of high purity substituted benz [E] indoles and the alkaline salts thereof
End treatment for a ring mechanism
Device for tamping railroad track adjacent the tie ends thereof
High acid aqueous nanocomposite dispersions
Elastomeric terionomer blends
Weep hole cover
Communications transmission system including facilities for suppressing electromagnetic interference
Process for recovering ruthenium
Packaging substrate having embedded capacitors and fabrication method thereof
Cellular fraud prevention using selective roaming