Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Method and apparatus for wireless communication in a mesh network with central control of communication relationships
Method and system for tracking mobile electronic devices while conserving cellular network resources
Mesa-shaped piezoelectric resonator element
Hair motion compositor system for use in a hair/fur pipeline
Toy vehicle housing
Retransmission control method, base station and mobile station
Image sensing apparatus and method of controlling the image sensing apparatus
  Randomly Featured Patents
Method of making semiconductor laser
Process of preparing lower vinyl chloride polymer by suspension polymerization
Portable cooking and heating stove
Crankshaft
Server cabinet
Method of removing color from waste water using an aqueous dispersion polymer
Herbicidal hydroxybenzyl-substituted heteroaryl compounds and derivatives thereof
Techniques for optimizing configuration partitioning
Universal battery charger
Method and apparatus for controlling transmitting, receiving, and re-transmission