Resources Contact Us Home
Method and system for e-beam scanning

Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.

  Recently Added Patents
Radiation detector array
Inkjet ink
Droplet generation and detection device, and droplet control device
Global codebook for coordinated multi-point processing
Battery module
Retrievable outgoing audio messaging
  Randomly Featured Patents
Easy release-detachable fishhook
Double-side printing system
System and method for social network trust assessment
FM stereo broadcasting apparatus and method
Oxidation-stabilized polyamide molding materials
Apparatusses and methods to supress unintended motion of a pointing device
Medical fastener strap
Method of manufacturing tee nuts
Magnetic recording disk
Cable guide arrangement