Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Liquid crystal panel and liquid crystal display
Integrated advance copper fuse combined with ESD/over-voltage/reverse polarity protection
Apparatus for performing timer management regarding a system timer scheduler service, and associated method
Fusing apparatus and image forming apparatus provided with the same, and heating apparatus
Plants and seeds of corn variety CV577261
Vehicle detection apparatus and method using magnetic sensor
Method for designing sunlight-reflection and heat-radiation multilayer film
  Randomly Featured Patents
Golf club head belt buckle
Neuromodulation catheters and associated systems and methods
PARALLEL/SERIAL CONVERSION CIRCUIT, SERIAL DATA GENERATION CIRCUIT, SYNCHRONIZATION SIGNAL GENERATION CIRCUIT, CLOCK SIGNAL GENERATION CIRCUIT, SERIAL DATA TRANSMISSION DEVICE, SERIAL DATA REC
Method for designing cell layout of a semiconductor integrated circuit with logic having a data flow
Corner connecting arrangement
Computer program products for systems with casing assemblies and netting chutes
Liquid crystal display device
Permanent magnet wrap spring clutch
Electromagnetically activated on-wheel air pump
Method for treating emissions