Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 16 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Image sensing apparatus and method of controlling the image sensing apparatus
Method for remotely measuring fluctuations in the optical index of refraction of a medium
Decontamination apparatus and method
Identifying media content in queries
Cooling structure for electronic device
Semiconductor device and method of manufacturing the same
Fixing device, fixing device control method, and image forming apparatus
  Randomly Featured Patents
Refillable propane cylinder and valve assembly therefore
Reminder device for pill containers
Gas laser apparatus, and method and device for monitoring blower
Capacitor switching contactor
Adaptive predictive coding encoder for compression of quantized digital audio signals
Method and apparatus for automatic insertion of a television signal from a remote source
Transmission gear with dog clutch gear and method for manufacturing the same
Storage and retrieval of concurrent query language execution results
Magnetic recording medium containing magnetic particles surface treated with a glycidyl compound
Balanced-unbalanced converting circuit, balanced-unbalanced converter, and communication device including the same