Resources Contact Us Home
Method and system for e-beam scanning

Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.

  Recently Added Patents
Non-intrusive processor tracing
Wire guide
Information display
Wireless network device including a polarization and spatial diversity antenna system
Plants and seeds of hybrid corn variety CH367819
Amnion-derived cells, methods of making and uses thereof
Granulated sweetening composition
  Randomly Featured Patents
Process chamber
Tool caddy
Convertible cooking unit with an oven
Combined radio and lamp
Sanitary storm and catch basin trap
Method of controlling an extruder
Monitoring device for detecting stress strain and method for using same
Process for preparing a 2-alkynyl substituted 5-amino-pyrazolo-[4,3-e]-1,2,4-triazolo[1,5-c]pyrimidine
Organic electroluminescent display device and method of fabrication
Lacquer binders, coating compositions and wire enamels based on polyamideimides and isocyanates carrying carbodiimide and/or uretone imine groups