Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Method for the hydrolysis of substituted formylamines into substituted amines
Block copolymer nanoparticle compositions
Wire guide
Method and system for acquiring support capability of mobile terminal by base station side system
Transmission terminal, transmission system, transmission method, and recording medium storing transmission control program
System and method for efficient resource management of a signal flow programmed digital signal processor code
Inductance element
  Randomly Featured Patents
Method of forming a semiconductor memory device having silicon nitride overlying only in peripheral circuit area
Thin film transistor organic light emitting diode structure
Light-curable mixture and light-sensitive copying material made therewith
Genes for heat resistant enzymes of amino acid biosynthetic pathway derived from thermophilic coryneform bacteria
Process for manufacturing a heat-resistant molded foam product
Method of making articles of edible or easily biodegradable material
Syringe holder
Night vision imaging system adapted for helmet mounting
Apparatus and media for recording data on two sides of a magnetic tape
Method of static reactive power compensation