Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Radio frequency distribution system and method
Secondary battery
Video bookmarking
Passive wireless memory device
Spindle motor and disk driving device
Electronic device, electronic device control method, and electronic device system
Light emitting module
  Randomly Featured Patents
LCD and display method thereof
Machine and method for making hardened confections having complementary parts joined in a unit
Spray nozzle for spray gun for forming a polyurethane layer on a surface
Low-energy extractive distillation process for dehydration of aqueous ethanol
Tape recorder and reproducer machine
Image processor, image processing method and storage medium
Adjustable coding reflector
Gas discharge electrodes
Fuel cell system and control method thereof
Transflective color LCD device