Resources Contact Us Home
Method and system for e-beam scanning

Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.

  Recently Added Patents
Methods and systems for sending messages regarding an emergency that occurred at a facility
Position detection device, pointing device and input device
Apparatus and method for transmitting and receiving data streams in wireless system
Fluorescent dyes, fluorescent dye kits, and methods of preparing labeled molecules
Lens module and method for manufacturing thereof
Stabilised prostaglandin composition
  Randomly Featured Patents
Method of making an insulating spacer for spacing apart panes of a multiple pane unit
Devices and methods for creating lesions in endocardial and surrounding tissue to isolate focal arrhythmia substrates
Preionization electrode for pulsed gas laser
Modified cyclic aliphatic polyamine
Image reading apparatus and image forming apparatus
Viscous coupling
Apoptosis-inducing polypeptides
DCT/Q/IQ/IDCT bypass algorithm in MPEG to AVC/H.264 transcoding
Ultra wideband communication system, method, and device with low noise pulse formation
Bicycle frame