Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Image processing apparatus, control method for the same, and storage medium
Electrode for a plasma torch
Modular microscope construction
Front cover of an electronic device
Tab visibility
Faucet handle
Method and system for remote delivery of email
  Randomly Featured Patents
Connector assembly and related methods of use
Faucet with pull-out spray
System and method for performing an optical tracking operation using relative referencing
Powder metal mixture including micronized cellulose fibers
Tuning mechanism for dither frequencies in a ring laser gyroscope
Combined flashlight and clip
Emergency elevator cab commandeering shuttle
Asymmetric hydrogenation of aromatic-substituted olefins using cationic ruthenium(III) complexes
Dual mode satellite/cellular terminal
Portable word-processor