Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Method and system for e-beam scanning










Image Number 10 for United States Patent #7276690.

The disclosure relates to a method and system of electron beam scanning for measurement, inspection or review. In accordance with one embodiment, the method includes a first scan on a region to collect first image data. The first image data is processed to determine information about a feature in the region. A scanning method is selected for imaging the feature. A second scan using the selected scanning method on the feature is then applied to collect second image data.








 
 
  Recently Added Patents
Process for recovering and recycling an acid catalyst
System and method for document orientation detection
Methods for integrating the production of cellulose nanofibrils with the production of cellulose nanocrystals
Method and apparatus for selective decoding in a wireless communication system
Vehicle fender
Method for installing industrial components in an environment
Magnesium metal-air battery
  Randomly Featured Patents
Circuit technique for eliminating impact ionization in a differential pair used in an output stage
High voltage modular battery with compression bladder
Device for separating solids from air
System and method for performing distributed video conferencing
Filter dehydrator
Cuff for connecting to an equipment, particularly a pipe
Damping apparatus for reciprocating pneumatic tools
Sleeping mattress
Methods for using OX-40 ligand to enhance an antigen specific immune response
Cover for a card